Surface and interface analyses of polymer brushes by synchrotron radiation

Taiki Hoshino, Yoshihito Tanaka, Hiroshi Jinnai, Atsushi Takahara

Research output: Contribution to journalArticlepeer-review

21 Citations (Scopus)


In the present review, we focus on the characterization of polymer brushes by quantum beam, which is regarded as a promising probe of surface and interface analysis. The polymer brushes were prepared on various shapes of surface, and proved to be benefit to various applications. Among them, the polymer brushes grafted on sphere nanoparticles and flat substrates are investigated as representative cases. The static structure of polymer brushes, especially the chain dimension of polymer brushes grafted on nanoparticles and a flat substrate, have been studied by small angle X-ray scattering (SAXS) and neutron reflectivity (NR), respectively. The microscopic dynamical properties of polymer brushes are also expected to be revealed by quantum beam. X-ray photon correlation spectroscopy (XPCS), a technique using a coherent X-ray, is one of the promising methods for microscopically understanding of dynamical properties of polymer brushes. Some of our recent studies about dynamical behavior of polymer brush immobilized nanoparticle by XPCS are also presented.

Original languageEnglish
Article number021014
Journaljournal of the physical society of japan
Issue number2
Publication statusPublished - Feb 2013

All Science Journal Classification (ASJC) codes

  • General Physics and Astronomy


Dive into the research topics of 'Surface and interface analyses of polymer brushes by synchrotron radiation'. Together they form a unique fingerprint.

Cite this