Suppression of roll-off characteristics of organic light-emitting diodes by narrowing current injection/transport area to 50 nm

Kyohei Hayashi; Hajime Nakanotani; Munetomo Inoue; Kou Yoshida; Oleksandr Mikhnenko; Thuc Quyen Nguyen; Chihaya Adachi

doi:10.1063/1.4913461

Suppression of roll-off characteristics of organic light-emitting diodes by narrowing current injection/transport area to 50 nm

Kyohei Hayashi, Hajime Nakanotani, Munetomo Inoue, Kou Yoshida, Oleksandr Mikhnenko, Thuc Quyen Nguyen, Chihaya Adachi

Applied Chemistry

Research output: Contribution to journal › Article › peer-review

49 Citations (Scopus)

Abstract

Using e-beam nanolithography, the current injection/transport area in organic light-emitting diodes (OLEDs) was confined into a narrow linear structure with a minimum width of 50 nm. This caused suppression of Joule heating and partial separation of polarons and excitons, so the charge density where the electroluminescent efficiency decays to the half of the initial value (J₀) was significantly improved. A device with a narrow current injection width of 50 nm exhibited a J₀ that was almost two orders of magnitude higher compared with that of the unpatterned OLED.

Original language	English
Article number	093301
Journal	Applied Physics Letters
Volume	106
Issue number	9
DOIs	https://doi.org/10.1063/1.4913461
Publication status	Published - Mar 2 2015

All Science Journal Classification (ASJC) codes

Physics and Astronomy (miscellaneous)

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10.1063/1.4913461

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abstract = "Using e-beam nanolithography, the current injection/transport area in organic light-emitting diodes (OLEDs) was confined into a narrow linear structure with a minimum width of 50 nm. This caused suppression of Joule heating and partial separation of polarons and excitons, so the charge density where the electroluminescent efficiency decays to the half of the initial value (J0) was significantly improved. A device with a narrow current injection width of 50 nm exhibited a J0 that was almost two orders of magnitude higher compared with that of the unpatterned OLED.",

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AU - Hayashi, Kyohei

AU - Nakanotani, Hajime

AU - Inoue, Munetomo

AU - Yoshida, Kou

AU - Mikhnenko, Oleksandr

AU - Nguyen, Thuc Quyen

AU - Adachi, Chihaya

PY - 2015/3/2

Y1 - 2015/3/2

N2 - Using e-beam nanolithography, the current injection/transport area in organic light-emitting diodes (OLEDs) was confined into a narrow linear structure with a minimum width of 50 nm. This caused suppression of Joule heating and partial separation of polarons and excitons, so the charge density where the electroluminescent efficiency decays to the half of the initial value (J0) was significantly improved. A device with a narrow current injection width of 50 nm exhibited a J0 that was almost two orders of magnitude higher compared with that of the unpatterned OLED.

AB - Using e-beam nanolithography, the current injection/transport area in organic light-emitting diodes (OLEDs) was confined into a narrow linear structure with a minimum width of 50 nm. This caused suppression of Joule heating and partial separation of polarons and excitons, so the charge density where the electroluminescent efficiency decays to the half of the initial value (J0) was significantly improved. A device with a narrow current injection width of 50 nm exhibited a J0 that was almost two orders of magnitude higher compared with that of the unpatterned OLED.

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Suppression of roll-off characteristics of organic light-emitting diodes by narrowing current injection/transport area to 50 nm

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