Study on the distribution of binary mixed counterions in surfactant adsorbed films by total reflection XAFS measurements

Y. Imai; H. H. Li; H. Takumi; H. Tanida; I. Watanabe; T. Takiue; H. Matsubara; M. Aratono

doi:10.1016/j.jcis.2012.08.044

Study on the distribution of binary mixed counterions in surfactant adsorbed films by total reflection XAFS measurements

Y. Imai, H. H. Li, H. Takumi, H. Tanida, I. Watanabe, T. Takiue, H. Matsubara, M. Aratono

Research output: Contribution to journal › Article › peer-review

9 Citations (Scopus)

Abstract

The total reflection X-ray absorption fine structure (TR-XAFS) technique was applied to adsorbed films at the surface of aqueous solutions of surfactant mixtures composed of dodecyltrimethylammonium bromide (DTAB) and dodecyltrimethylammonium tetrafluoroborate (DTABF ₄). The obtained XAFS spectra were expressed as linear combinations of two specific spectra corresponding to fully hydrated bromide ions (free-Br) and partially dehydrated bromide ions adsorbed to the hydrophilic groups of surfactant ions (bound-Br) at the surface. The ratio of free- and bound-Br ions was determined as a function of surface tension and surface composition of the surfactants. Taking also the results in our previous studies on the DTAB - dodecyltrimethylammonium chloride (DTAC) and 1-hexyl-3-methylimidazolium bromide (HMIMBr) - 1-hexyl-3-methylimidazolium tetrafluoroborate (HMIMBF ₄) mixed systems into consideration, the relation between counterion distribution and miscibility of counterions at the solution surface was deduced for the surfactant mixtures having common surfactant ions but different counterions.

Original language	English
Pages (from-to)	219-224
Number of pages	6
Journal	Journal of Colloid And Interface Science
Volume	388
Issue number	1
DOIs	https://doi.org/10.1016/j.jcis.2012.08.044
Publication status	Published - Dec 15 2012

All Science Journal Classification (ASJC) codes

Electronic, Optical and Magnetic Materials
Biomaterials
Surfaces, Coatings and Films
Colloid and Surface Chemistry

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10.1016/j.jcis.2012.08.044

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title = "Study on the distribution of binary mixed counterions in surfactant adsorbed films by total reflection XAFS measurements",

abstract = "The total reflection X-ray absorption fine structure (TR-XAFS) technique was applied to adsorbed films at the surface of aqueous solutions of surfactant mixtures composed of dodecyltrimethylammonium bromide (DTAB) and dodecyltrimethylammonium tetrafluoroborate (DTABF 4). The obtained XAFS spectra were expressed as linear combinations of two specific spectra corresponding to fully hydrated bromide ions (free-Br) and partially dehydrated bromide ions adsorbed to the hydrophilic groups of surfactant ions (bound-Br) at the surface. The ratio of free- and bound-Br ions was determined as a function of surface tension and surface composition of the surfactants. Taking also the results in our previous studies on the DTAB - dodecyltrimethylammonium chloride (DTAC) and 1-hexyl-3-methylimidazolium bromide (HMIMBr) - 1-hexyl-3-methylimidazolium tetrafluoroborate (HMIMBF 4) mixed systems into consideration, the relation between counterion distribution and miscibility of counterions at the solution surface was deduced for the surfactant mixtures having common surfactant ions but different counterions.",

author = "Y. Imai and Li, {H. H.} and H. Takumi and H. Tanida and I. Watanabe and T. Takiue and H. Matsubara and M. Aratono",

note = "Funding Information: This work was supported by a Grant-in-Aid for Scientific Research on Priority Area (No. 20175970) and by that for Scientific Research (B) (No. 21350078) from the Ministry of Education, Science, Sports and Culture. This work has been performed under the approval of the Photon Factory Advisory Committee (Proposal No. 2010 G504), which is greatly appreciated.",

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AU - Imai, Y.

AU - Li, H. H.

AU - Takumi, H.

AU - Tanida, H.

AU - Watanabe, I.

AU - Takiue, T.

AU - Matsubara, H.

AU - Aratono, M.

N1 - Funding Information: This work was supported by a Grant-in-Aid for Scientific Research on Priority Area (No. 20175970) and by that for Scientific Research (B) (No. 21350078) from the Ministry of Education, Science, Sports and Culture. This work has been performed under the approval of the Photon Factory Advisory Committee (Proposal No. 2010 G504), which is greatly appreciated.

PY - 2012/12/15

Y1 - 2012/12/15

N2 - The total reflection X-ray absorption fine structure (TR-XAFS) technique was applied to adsorbed films at the surface of aqueous solutions of surfactant mixtures composed of dodecyltrimethylammonium bromide (DTAB) and dodecyltrimethylammonium tetrafluoroborate (DTABF 4). The obtained XAFS spectra were expressed as linear combinations of two specific spectra corresponding to fully hydrated bromide ions (free-Br) and partially dehydrated bromide ions adsorbed to the hydrophilic groups of surfactant ions (bound-Br) at the surface. The ratio of free- and bound-Br ions was determined as a function of surface tension and surface composition of the surfactants. Taking also the results in our previous studies on the DTAB - dodecyltrimethylammonium chloride (DTAC) and 1-hexyl-3-methylimidazolium bromide (HMIMBr) - 1-hexyl-3-methylimidazolium tetrafluoroborate (HMIMBF 4) mixed systems into consideration, the relation between counterion distribution and miscibility of counterions at the solution surface was deduced for the surfactant mixtures having common surfactant ions but different counterions.

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Study on the distribution of binary mixed counterions in surfactant adsorbed films by total reflection XAFS measurements

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