TY - GEN
T1 - Structuralization of metal nanoparticles by photoinduced aggregation
AU - Lee, Kok Foong
AU - Hayashi, Terutake
AU - Takaya, Yasuhiro
PY - 2010
Y1 - 2010
N2 - Aggregate of metal nanoparticles is an ideal material for sensing devices such as SERS. Controlled production of aggregates with desired parameters is very important to optimize its usage. We proposed a method to produce aggregates of metal nanoparticles through structuralization of metal nanoparticles by using photoinduced aggregation with optical trapping technique. In this study, we demonstrate that the gold nanoparticles can be gathered, aggregated and deposited on the surface of silicon wafer through optical trapping and photoinduced aggregation. 532nm green laser which is near-resonant to the plasmon resonance wavelength of the gold nanoparticles, is found to cause more aggressive reaction than the off-resonant 1064nm YAG laser. The growth of the aggregates formed is also found to be influenced by the laser exposure time.
AB - Aggregate of metal nanoparticles is an ideal material for sensing devices such as SERS. Controlled production of aggregates with desired parameters is very important to optimize its usage. We proposed a method to produce aggregates of metal nanoparticles through structuralization of metal nanoparticles by using photoinduced aggregation with optical trapping technique. In this study, we demonstrate that the gold nanoparticles can be gathered, aggregated and deposited on the surface of silicon wafer through optical trapping and photoinduced aggregation. 532nm green laser which is near-resonant to the plasmon resonance wavelength of the gold nanoparticles, is found to cause more aggressive reaction than the off-resonant 1064nm YAG laser. The growth of the aggregates formed is also found to be influenced by the laser exposure time.
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M3 - Conference contribution
AN - SCOPUS:84871593847
SN - 9781617820199
T3 - 10th International Symposium on Measurement and Quality Control 2010, ISMQC 2010
SP - 366
EP - 369
BT - 10th International Symposium on Measurement and Quality Control 2010, ISMQC 2010
T2 - 10th International Symposium on Measurement and Quality Control 2010, ISMQC 2010
Y2 - 5 September 2010 through 9 September 2010
ER -