Structural and analytical characterization of as-grown MgB2 film sputtered on differently oriented α-Al2O3 substrate

W. J. Moon, K. Kaneko, S. Toh, M. Saunders, A. Saito, Z. Wang, H. Abe, M. Naito

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    5 Citations (Scopus)

    Abstract

    Superconducting MgB2 films were prepared on differently oriented α-Al2O3 substrates, C- and R-planes, which yielded superconducting transition temperatures of about 28 K. The electric resistivity of the MgB2 film deposited on an R-plane substrate is 300 μΩ cm, six times larger than that on a C-plane substrate, 50 μΩ cm. To understand these differences in the electrical properties, various transmission electron microscopes were used to carry out a structural and the compositional analysis. It was shown from selected-area electron diffraction patterns that the microstructure consists of a mixture of columnar MgB2 grains and amorphous phases in the case of the R-plane specimen, while no amorphous phase was present in the case of the C-plane specimen.

    Original languageEnglish
    Pages (from-to)92-100
    Number of pages9
    JournalSuperconductor Science and Technology
    Volume18
    Issue number1
    DOIs
    Publication statusPublished - Jan 2005

    All Science Journal Classification (ASJC) codes

    • Ceramics and Composites
    • Condensed Matter Physics
    • Metals and Alloys
    • Electrical and Electronic Engineering
    • Materials Chemistry

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