Status of the heavy ion beam probe system in the Large Helical Device

M. Nishiura, T. Ido, A. Shimizu, H. Nakano, T. Kato, S. Kato, Y. Hamada, V. P. Shevelko, R. K. Janev, M. Wada

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1 Citation (Scopus)

Abstract

A heavy ion beam probe (HIBP) system has been installed into the Large Helical Device (LHD) to measure the spatial profile of the plasma potential and density fluctuations. The optimization of the HIBP system, especially the beam injector, is described. The negative ion beam is required for the MeV beam production in a tandem accelerator. A sputter-type heavy negative ion source has been developed as an intense Au- beam source to produce Au+ beams with energy in the MeV range. The extraction electrodes and the Einzel lens system of the ion source have been designed taking into account the beam optics, and installed into the real machine. Throughout the plasma diagnostics on LHD experiments, the consumptions of vaporized caesium and gold target are being characterized for practical operations. In addition, the experimental charge fractions are compared with the theoretical fractions for understanding the charge-changing behavior of Au- ions and optimizing the fraction of Au+ ions at the exit of the tandem accelerator of the HIBP system.

Original languageEnglish
Article number02C713
JournalReview of Scientific Instruments
Volume79
Issue number2
DOIs
Publication statusPublished - 2008
Externally publishedYes

All Science Journal Classification (ASJC) codes

  • Instrumentation

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