Spin-polarization measurement of the secondary electrons emitted from silicon steel single crystal (001) surface

Kaoru Ijima; Seigi Mizuno; Naosuke Kawakami; Kazunobu Hayakawa

doi:10.3131/jvsj.42.357

Spin-polarization measurement of the secondary electrons emitted from silicon steel single crystal (001) surface

Kaoru Ijima, Seigi Mizuno, Naosuke Kawakami, Kazunobu Hayakawa

Research output: Contribution to journal › Article › peer-review

Abstract

A spin-polarized scanning electron microscope (SP-SEM) which operates in reflection high energy electron diffraction (RHEED) mode of the primary electron beam has been developed. This apparatus opens a way to relate the magnetic domain structures with the surface crystal structure directly. This report describes the observation of SP-SEM images with corresponding RHEED patterns of a silicon steel single crystal (001) surface.

Original language	English
Pages (from-to)	357-360
Number of pages	4
Journal	Shinku/Journal of the Vacuum Society of Japan
Volume	42
Issue number	3
DOIs	https://doi.org/10.3131/jvsj.42.357
Publication status	Published - 1999

All Science Journal Classification (ASJC) codes

Condensed Matter Physics
Surfaces, Coatings and Films
Electrical and Electronic Engineering

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title = "Spin-polarization measurement of the secondary electrons emitted from silicon steel single crystal (001) surface",

abstract = "A spin-polarized scanning electron microscope (SP-SEM) which operates in reflection high energy electron diffraction (RHEED) mode of the primary electron beam has been developed. This apparatus opens a way to relate the magnetic domain structures with the surface crystal structure directly. This report describes the observation of SP-SEM images with corresponding RHEED patterns of a silicon steel single crystal (001) surface.",

author = "Kaoru Ijima and Seigi Mizuno and Naosuke Kawakami and Kazunobu Hayakawa",

year = "1999",

doi = "10.3131/jvsj.42.357",

language = "English",

volume = "42",

pages = "357--360",

journal = "Shinku/Journal of the Vacuum Society of Japan",

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publisher = "Shinku Kyokai",

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T1 - Spin-polarization measurement of the secondary electrons emitted from silicon steel single crystal (001) surface

AU - Ijima, Kaoru

AU - Mizuno, Seigi

AU - Kawakami, Naosuke

AU - Hayakawa, Kazunobu

PY - 1999

Y1 - 1999

N2 - A spin-polarized scanning electron microscope (SP-SEM) which operates in reflection high energy electron diffraction (RHEED) mode of the primary electron beam has been developed. This apparatus opens a way to relate the magnetic domain structures with the surface crystal structure directly. This report describes the observation of SP-SEM images with corresponding RHEED patterns of a silicon steel single crystal (001) surface.

AB - A spin-polarized scanning electron microscope (SP-SEM) which operates in reflection high energy electron diffraction (RHEED) mode of the primary electron beam has been developed. This apparatus opens a way to relate the magnetic domain structures with the surface crystal structure directly. This report describes the observation of SP-SEM images with corresponding RHEED patterns of a silicon steel single crystal (001) surface.

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JF - Shinku/Journal of the Vacuum Society of Japan

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ER -

Spin-polarization measurement of the secondary electrons emitted from silicon steel single crystal (001) surface

Abstract

All Science Journal Classification (ASJC) codes

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