A spin-polarized scanning electron microscope (SP-SEM) which operates in reflection high energy electron diffraction (RHEED) mode of the primary electron beam has been developed. This apparatus opens a way to relate the magnetic domain structures with the surface crystal structure directly. This report describes the observation of SP-SEM images with corresponding RHEED patterns of a silicon steel single crystal (001) surface.
All Science Journal Classification (ASJC) codes
- Condensed Matter Physics
- Surfaces, Coatings and Films
- Electrical and Electronic Engineering