TY - JOUR
T1 - Spectral reflectance of the close-packed structure of silica microspheres
AU - Kihara, Masahiro
AU - Miyazaki, Koji
AU - Tsukamoto, Hiroshi
N1 - Funding Information:
Acknowledgments The authors thank Prof. Gang Chen of Massachusetts Institute of Technology, Profs. Toshiro Makino and Hidenobu Wakabayashi of Kyoto University, Prof. Katsunori Hanamura of Tokyo Institute of Technology, and Prof. Jun Yamada of Shibaura Institute of Technology for helpful discussions. K. Miyazaki gratefully acknowledges the support by JSPS under Grant No. 14655086, Tanikawa foundation, and Hosokawa Powder Technology Foundation.
PY - 2008/12
Y1 - 2008/12
N2 - The spectral reflectance of microperiodic structures of silica microspheres was investigated. The electromagnetic dispersion relation in a close-packed structure of silica spheres is computed. The three-dimensional close-packed structures, self-assembled with silica microspheres (2 μm and 3 μm), were rapidly fabricated over a large area. Specular reflectance was measured by using Fourier transform-infrared spectroscopy (FT-IR). The experimental results were evaluated by a modification of Bragg's law, taking into account Snell's law of refraction, and calculations of multiple reflections and the scalar wave approximation method. In addition, to expand the reflection wavelength range, a double-layered sample was fabricated, and its spectral reflectance was determined.
AB - The spectral reflectance of microperiodic structures of silica microspheres was investigated. The electromagnetic dispersion relation in a close-packed structure of silica spheres is computed. The three-dimensional close-packed structures, self-assembled with silica microspheres (2 μm and 3 μm), were rapidly fabricated over a large area. Specular reflectance was measured by using Fourier transform-infrared spectroscopy (FT-IR). The experimental results were evaluated by a modification of Bragg's law, taking into account Snell's law of refraction, and calculations of multiple reflections and the scalar wave approximation method. In addition, to expand the reflection wavelength range, a double-layered sample was fabricated, and its spectral reflectance was determined.
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U2 - 10.1007/s10765-008-0483-0
DO - 10.1007/s10765-008-0483-0
M3 - Article
AN - SCOPUS:57749202677
SN - 0195-928X
VL - 29
SP - 2136
EP - 2148
JO - International Journal of Thermophysics
JF - International Journal of Thermophysics
IS - 6
ER -