Six-fold coordinated silicon at grain boundaries in sintered α-Al2O3

Kenji Kaneko; Isao Tanaka; Masato Yoshiya

doi:10.1063/1.120681

Six-fold coordinated silicon at grain boundaries in sintered α-Al₂O₃

Kenji Kaneko, Isao Tanaka, Masato Yoshiya

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7 Citations (Scopus)

Abstract

High-resolution transmission electron microscopy (HRTEM) and analytical electron microscopy (AEM) have been carried out on Si-doped sintered α-Al₂O₃. HRTEM shows that there is no amorphous phase at grain boundaries. The Si-segregated boundary is found to be much more sensitive to irradiation damage than undoped Al₂O₃ grain boundaries. AEM with energy dispersive x-ray spectroscopy (EDS) shows the significant segregation of Si at grain boundaries, and AEM with electron energy-loss spectroscopy (EELS) reveals the existence of six-fold coordinated Si at the grain boundaries. The theoretical calculations obtained by the molecular orbital method support the data obtained by EELS.

Original language	English
Pages (from-to)	191-193
Number of pages	3
Journal	Applied Physics Letters
Volume	72
Issue number	2
DOIs	https://doi.org/10.1063/1.120681
Publication status	Published - Dec 1 1998
Externally published	Yes

All Science Journal Classification (ASJC) codes

Physics and Astronomy (miscellaneous)

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10.1063/1.120681

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@article{c70ce302ba11471bbb900fc649aa28ba,

title = "Six-fold coordinated silicon at grain boundaries in sintered α-Al2O3",

abstract = "High-resolution transmission electron microscopy (HRTEM) and analytical electron microscopy (AEM) have been carried out on Si-doped sintered α-Al2O3. HRTEM shows that there is no amorphous phase at grain boundaries. The Si-segregated boundary is found to be much more sensitive to irradiation damage than undoped Al2O3 grain boundaries. AEM with energy dispersive x-ray spectroscopy (EDS) shows the significant segregation of Si at grain boundaries, and AEM with electron energy-loss spectroscopy (EELS) reveals the existence of six-fold coordinated Si at the grain boundaries. The theoretical calculations obtained by the molecular orbital method support the data obtained by EELS.",

author = "Kenji Kaneko and Isao Tanaka and Masato Yoshiya",

year = "1998",

month = dec,

day = "1",

doi = "10.1063/1.120681",

language = "English",

volume = "72",

pages = "191--193",

journal = "Applied Physics Letters",

issn = "0003-6951",

publisher = "American Institute of Physics Publising LLC",

number = "2",

}

TY - JOUR

T1 - Six-fold coordinated silicon at grain boundaries in sintered α-Al2O3

AU - Kaneko, Kenji

AU - Tanaka, Isao

AU - Yoshiya, Masato

PY - 1998/12/1

Y1 - 1998/12/1

N2 - High-resolution transmission electron microscopy (HRTEM) and analytical electron microscopy (AEM) have been carried out on Si-doped sintered α-Al2O3. HRTEM shows that there is no amorphous phase at grain boundaries. The Si-segregated boundary is found to be much more sensitive to irradiation damage than undoped Al2O3 grain boundaries. AEM with energy dispersive x-ray spectroscopy (EDS) shows the significant segregation of Si at grain boundaries, and AEM with electron energy-loss spectroscopy (EELS) reveals the existence of six-fold coordinated Si at the grain boundaries. The theoretical calculations obtained by the molecular orbital method support the data obtained by EELS.

AB - High-resolution transmission electron microscopy (HRTEM) and analytical electron microscopy (AEM) have been carried out on Si-doped sintered α-Al2O3. HRTEM shows that there is no amorphous phase at grain boundaries. The Si-segregated boundary is found to be much more sensitive to irradiation damage than undoped Al2O3 grain boundaries. AEM with energy dispersive x-ray spectroscopy (EDS) shows the significant segregation of Si at grain boundaries, and AEM with electron energy-loss spectroscopy (EELS) reveals the existence of six-fold coordinated Si at the grain boundaries. The theoretical calculations obtained by the molecular orbital method support the data obtained by EELS.

UR - http://www.scopus.com/inward/record.url?scp=0012569844&partnerID=8YFLogxK

UR - http://www.scopus.com/inward/citedby.url?scp=0012569844&partnerID=8YFLogxK

U2 - 10.1063/1.120681

DO - 10.1063/1.120681

M3 - Article

AN - SCOPUS:0012569844

SN - 0003-6951

VL - 72

SP - 191

EP - 193

JO - Applied Physics Letters

JF - Applied Physics Letters

IS - 2

ER -

Six-fold coordinated silicon at grain boundaries in sintered α-Al₂O₃

Abstract

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