Simplification of X-ray absorption correction in thin-sample quantitative microanalysis

Zenji Horita; Takeshi Sano; Minoru Nemoto

doi:10.1016/0304-3991(87)90152-5

Simplification of X-ray absorption correction in thin-sample quantitative microanalysis

Zenji Horita, Takeshi Sano, Minoru Nemoto

Research output: Contribution to journal › Article › peer-review

56 Citations (Scopus)

Abstract

It is shown that the correction of X-ray absorption in thin-sample quantitative microanalysis does not necessarily require the measurement of foil thicknesses when the extrapolation method is used. With this method, it is sufficient to use the characteristic X-ray intensity as an alternative to the foil thickness. This method is applied to the determination of k_AlNi and k_TaNi factors and the microanalysis of γ and γ' phases in a Ni-Al-Ta ternary alloy.

Original language	English
Pages (from-to)	271-276
Number of pages	6
Journal	Ultramicroscopy
Volume	21
Issue number	3
DOIs	https://doi.org/10.1016/0304-3991(87)90152-5
Publication status	Published - 1987

All Science Journal Classification (ASJC) codes

Electronic, Optical and Magnetic Materials
Atomic and Molecular Physics, and Optics
Instrumentation

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10.1016/0304-3991(87)90152-5

Cite this

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title = "Simplification of X-ray absorption correction in thin-sample quantitative microanalysis",

abstract = "It is shown that the correction of X-ray absorption in thin-sample quantitative microanalysis does not necessarily require the measurement of foil thicknesses when the extrapolation method is used. With this method, it is sufficient to use the characteristic X-ray intensity as an alternative to the foil thickness. This method is applied to the determination of kAlNi and kTaNi factors and the microanalysis of γ and γ' phases in a Ni-Al-Ta ternary alloy.",

author = "Zenji Horita and Takeshi Sano and Minoru Nemoto",

year = "1987",

doi = "10.1016/0304-3991(87)90152-5",

language = "English",

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journal = "Ultramicroscopy",

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T1 - Simplification of X-ray absorption correction in thin-sample quantitative microanalysis

AU - Horita, Zenji

AU - Sano, Takeshi

AU - Nemoto, Minoru

PY - 1987

Y1 - 1987

N2 - It is shown that the correction of X-ray absorption in thin-sample quantitative microanalysis does not necessarily require the measurement of foil thicknesses when the extrapolation method is used. With this method, it is sufficient to use the characteristic X-ray intensity as an alternative to the foil thickness. This method is applied to the determination of kAlNi and kTaNi factors and the microanalysis of γ and γ' phases in a Ni-Al-Ta ternary alloy.

AB - It is shown that the correction of X-ray absorption in thin-sample quantitative microanalysis does not necessarily require the measurement of foil thicknesses when the extrapolation method is used. With this method, it is sufficient to use the characteristic X-ray intensity as an alternative to the foil thickness. This method is applied to the determination of kAlNi and kTaNi factors and the microanalysis of γ and γ' phases in a Ni-Al-Ta ternary alloy.

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U2 - 10.1016/0304-3991(87)90152-5

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VL - 21

SP - 271

EP - 276

JO - Ultramicroscopy

JF - Ultramicroscopy

IS - 3

ER -

Simplification of X-ray absorption correction in thin-sample quantitative microanalysis

Abstract

All Science Journal Classification (ASJC) codes

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