Simplification of X-ray absorption correction in thin-sample quantitative microanalysis

Zenji Horita, Takeshi Sano, Minoru Nemoto

    Research output: Contribution to journalArticlepeer-review

    56 Citations (Scopus)


    It is shown that the correction of X-ray absorption in thin-sample quantitative microanalysis does not necessarily require the measurement of foil thicknesses when the extrapolation method is used. With this method, it is sufficient to use the characteristic X-ray intensity as an alternative to the foil thickness. This method is applied to the determination of kAlNi and kTaNi factors and the microanalysis of γ and γ' phases in a Ni-Al-Ta ternary alloy.

    Original languageEnglish
    Pages (from-to)271-276
    Number of pages6
    Issue number3
    Publication statusPublished - 1987

    All Science Journal Classification (ASJC) codes

    • Electronic, Optical and Magnetic Materials
    • Atomic and Molecular Physics, and Optics
    • Instrumentation


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