TY - GEN
T1 - Silicon carbide growth
T2 - 2006 MRS Spring Meeting
AU - Pons, Michel
AU - Nishizawa, Shin Ichi
AU - Wellmann, Peter
AU - Blanquet, Elisabeth
AU - Chaussende, Didier
AU - Dedulle, Jean Marc
PY - 2006
Y1 - 2006
N2 - Modeling and simulation of the SiC growth processes, Physical Vapor Transport (PVT), Chemical Vapor Deposition (CVD) and hybrid techniques, are sufficiently mature to be used as a training tool for engineers as well as a growth machine design tool, e.g. when building new process equipment or up-scaling old ones. It is possible (i) to simulate accurately temperature and deposition distributions, as well as doping (ii) to quantify the limiting phenomena, (iii) to understand the important role of different precursors in CVD and hydrogen additions in PVT. The first conclusion of this paper is the importance of the "effective" C/Si ratio during CVD epitaxy in hot-wall reactors and its capability to explain the doping concentrations. The second conclusion is the influence of the C/Si ratio in alternative bulk growth technique involving gas additions. Preliminary results show that fine tuning of H2 or precursor additions allow a better control of concentrations of residual and intentional doping.
AB - Modeling and simulation of the SiC growth processes, Physical Vapor Transport (PVT), Chemical Vapor Deposition (CVD) and hybrid techniques, are sufficiently mature to be used as a training tool for engineers as well as a growth machine design tool, e.g. when building new process equipment or up-scaling old ones. It is possible (i) to simulate accurately temperature and deposition distributions, as well as doping (ii) to quantify the limiting phenomena, (iii) to understand the important role of different precursors in CVD and hydrogen additions in PVT. The first conclusion of this paper is the importance of the "effective" C/Si ratio during CVD epitaxy in hot-wall reactors and its capability to explain the doping concentrations. The second conclusion is the influence of the C/Si ratio in alternative bulk growth technique involving gas additions. Preliminary results show that fine tuning of H2 or precursor additions allow a better control of concentrations of residual and intentional doping.
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U2 - 10.1557/proc-0911-b04-02
DO - 10.1557/proc-0911-b04-02
M3 - Conference contribution
AN - SCOPUS:33750294711
SN - 1558998721
SN - 9781558998728
T3 - Materials Research Society Symposium Proceedings
SP - 67
EP - 78
BT - Silicon Carbide 2006 - Materials, Processing and Devices
PB - Materials Research Society
Y2 - 18 April 2006 through 20 April 2006
ER -