Abstract
Using soda-lime glass with a nano-stripe pattern as a test specimen, we demonstrated self-organized near-field etching with a continuum-wave laser (λ=532 nm) light source. Atomic force microscopy confirmed that near-field etching decreases the flank roughness of the corrugations as well as the roughness of the flat surface.
| Original language | English |
|---|---|
| Pages (from-to) | 527-530 |
| Number of pages | 4 |
| Journal | Applied Physics B: Lasers and Optics |
| Volume | 103 |
| Issue number | 3 |
| DOIs | |
| Publication status | Published - Jun 2011 |
| Externally published | Yes |
All Science Journal Classification (ASJC) codes
- Physics and Astronomy (miscellaneous)
- General Physics and Astronomy
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