Searching for O-X-B mode-conversion window with monitoring of stray microwave radiation in LHD

H. Igami, S. Kubo, H. P. Laqua, K. Nagasaki, S. Inagaki, T. Notake, T. Shimozuma, Y. Yoshimura, T. Mutoh

Research output: Contribution to journalArticlepeer-review

23 Citations (Scopus)

Abstract

In the Large Helical Device, the stray microwave radiation is monitored by using so-called sniffer probes during electron cyclotron heating. In monitoring the stray radiation, we changed the microwave beam injection angle and search the O-X-B mode-conversion window to excite electron Bernstein waves (EBWs). When the microwave beam is injected toward the vicinity of the predicted O-X-B mode-conversion window, the electron temperature rises in the central part of overdense plasmas. In that case, the stray radiation level near the injection antenna becomes low. These results indicate that monitoring the stray radiation near the injection antenna is helpful in confirming the effectiveness of excitation of EBWs simply without precise analysis.

Original languageEnglish
Article number10E931
JournalReview of Scientific Instruments
Volume77
Issue number10
DOIs
Publication statusPublished - 2006
Externally publishedYes

All Science Journal Classification (ASJC) codes

  • Instrumentation

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