Reverse bias dependent impedance and dielectric properties of Al/n-NC FeSi2/p-Si/Pd heterostructures formed by facing-targets sputtering

Nattakorn Borwornpornmetee, Rawiwan Chaleawpong, Peerasil Charoenyuenyao, Adison Nopparuchikun, Boonchoat Paosawatyanyong, Phongsaphak Sittimart, Tsuyoshi Yoshitake, Nathaporn Promros

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