Reliability and degradation behavior of a InGaAsP/InP waveguide photodiode for subscriber systems

Hiroyasu Mawatari, Mitsuo Fukuda, Kazutoshi Kato, Atsuo Kozen, Masahiro Yuda, Tatsuya Takeshita, Naoto Uchida, Hiromu Toba

Research output: Contribution to conferencePaperpeer-review

2 Citations (Scopus)

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