TY - JOUR
T1 - Refractive index dispersion of gallium lanthanum sulfide and oxysulfide glasses
AU - Yayama, Hiroyuki
AU - Fujino, Shigeru
AU - Morinaga, Kenji
AU - Takebe, Hiromichi
AU - Hewak, Daniel W.
AU - Payne, David N.
N1 - Funding Information:
The authors thank M. Kluth for glass preparation. This research was supported by Grants-in Aid for Scientific Research (B) No. 10450281 from the Ministry of Education, Science and Culture of the Japanese Government.
PY - 1998/10/1
Y1 - 1998/10/1
N2 - Refractive indexes were measured for Ga2S3-La2S3 and Ga2S3-La2O3 samples in the range of 0.48-1.71 nm using the minimum deviation method. Data are analyzed by the Wemple equation, which is based on the single-oscillator model. These samples have relatively large average bandgaps, E0, and electronic oscillator strengths, Ed, in comparison with other chalcogenide glasses. Possible origins of these features are discussed.
AB - Refractive indexes were measured for Ga2S3-La2S3 and Ga2S3-La2O3 samples in the range of 0.48-1.71 nm using the minimum deviation method. Data are analyzed by the Wemple equation, which is based on the single-oscillator model. These samples have relatively large average bandgaps, E0, and electronic oscillator strengths, Ed, in comparison with other chalcogenide glasses. Possible origins of these features are discussed.
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U2 - 10.1016/S0022-3093(98)00737-6
DO - 10.1016/S0022-3093(98)00737-6
M3 - Article
AN - SCOPUS:0032183183
SN - 0022-3093
VL - 239
SP - 187
EP - 191
JO - Journal of Non-Crystalline Solids
JF - Journal of Non-Crystalline Solids
IS - 1-3
ER -