Abstract
A method for density profile reconstruction by using a heavy ion beam probe was presented. The feasibility of the proposed method was demonstrated by performing a model calculation. The method provides a faster profile measurement of a temporal resolution of a few millisecond, in addition to quite good spatial resolution with millimeter.
Original language | English |
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Pages (from-to) | 3335-3340 |
Number of pages | 6 |
Journal | Review of Scientific Instruments |
Volume | 74 |
Issue number | 7 |
DOIs | |
Publication status | Published - Jul 2003 |
Externally published | Yes |
All Science Journal Classification (ASJC) codes
- Instrumentation