Abstract
Doubly-oriented films of poly-(di-methyl-silane) (PDMS) were prepared by evaporation under controlled conditions on unidirectionally oriented poly(tetra-fluoro-ethylene) (PTFE) thin layer, which was mechanically deposited on fused quartz plate. It was confirmed by X-ray diffraction and polarized absorption measurements that the silicon backbone chains with all-trans conformation laid along the direction of PTFE orientation, and that a particular crystalline plane (110) was parallel to the PTFE layer. PDMS films with double orientation showed a new absorption which appeared only in the polarized spectrum parallel to the direction of chains, and in lower energy region, than the main peak at 4.1 eV.
Original language | English |
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Pages (from-to) | 649-652 |
Number of pages | 4 |
Journal | Journal of Non-Crystalline Solids |
Volume | 198-200 |
Issue number | PART 2 |
DOIs | |
Publication status | Published - May 1996 |
Externally published | Yes |
All Science Journal Classification (ASJC) codes
- Electronic, Optical and Magnetic Materials
- Ceramics and Composites
- Condensed Matter Physics
- Materials Chemistry