Precise measurement of low diffusion coefficients using radioactive tracers

Yoshiaki Iijima, Hiroyuki Nitta, Ryusuke Nakamura, Koichi Takasawa, Akiko Inoue, Shigeru Takemoto, Yoshihiro Yamazaki

Research output: Contribution to journalArticlepeer-review

10 Citations (Scopus)


Experimental techniques for precise determination of low tracer diffusion coefficients in solid metals and alloys using radioisotopes are reviewed. Sputter-microsectioning method is most useful to measure submicron diffusion profiles at low temperatures. Measurements of tracer diffusivity along grain boundaries and dislocations in iron and stainless steels from the analysis of type C kinetics as well as type B kinetics are discussed.

Original languageEnglish
Pages (from-to)321-331
Number of pages11
JournalNippon Kinzoku Gakkaishi/Journal of the Japan Institute of Metals
Issue number4
Publication statusPublished - Apr 2005
Externally publishedYes

All Science Journal Classification (ASJC) codes

  • Condensed Matter Physics
  • Mechanics of Materials
  • Metals and Alloys
  • Materials Chemistry


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