Pilot allocation for multi-cell TDD massive MIMO systems

Wanming Hao, Osamu Muta, Haris Gacanin, Hiroshi Furukawa

Research output: Chapter in Book/Report/Conference proceedingConference contribution

3 Citations (Scopus)


Pilot contamination due to the pilot reuse in adjacent cells is a serious problem in time-division duplex (TDD) massive multi-input multiple-output (MIMO) system. Therefore, the pilot allocation is significant for improving the performance of the system. In this paper, we formulate the pilot allocation optimization problem for maximizing uplink sum rate of the system. To reduce the required complexity for finding the optimum pilot allocation, we propose a low-complexity pilot allocation algorithm, where the formulated problem is decoupled into multiple subproblems; in each subproblem, the pilot allocation at a given cell is optimized while fixing the pilot allocation in other cells. This process is continued until the achievable sum rate converges. Through multiple iterations, the optimum pilot allocation is found. In addition, to improve users' fairness, we formulate a fairness aware pilot allocation as maximization problem of sum of user's logarithmic rate and solve the formulated problem using a similar algorithm. Simulation results show that the proposed algorithms obtain good performance comparable to the exhaustive search algorithm, meanwhile the users' fairness is improved.

Original languageEnglish
Title of host publication2017 IEEE 86th Vehicular Technology Conference, VTC Fall 2017 - Proceedings
PublisherInstitute of Electrical and Electronics Engineers Inc.
Number of pages5
ISBN (Electronic)9781509059355
Publication statusPublished - Feb 8 2018
Event86th IEEE Vehicular Technology Conference, VTC Fall 2017 - Toronto, Canada
Duration: Sept 24 2017Sept 27 2017

Publication series

NameIEEE Vehicular Technology Conference
ISSN (Print)1550-2252


Other86th IEEE Vehicular Technology Conference, VTC Fall 2017

All Science Journal Classification (ASJC) codes

  • Computer Science Applications
  • Electrical and Electronic Engineering
  • Applied Mathematics


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