Percolation model of excess electrical noise in transition-edge sensors

M. A. Lindeman, M. B. Anderson, S. R. Bandler, N. Bilgri, J. Chervenak, S. Gwynne Crowder, S. Fallows, E. Figueroa-Feliciano, F. Finkbeiner, N. Iyomoto, R. Kelley, C. A. Kilbourne, T. Lai, J. Man, D. McCammon, K. L. Nelms, F. S. Porter, L. E. Rocks, T. Saab, J. SadleirG. Vidugiris

Research output: Contribution to journalArticlepeer-review

13 Citations (Scopus)


We present a geometrical model to describe excess electrical noise in transition-edge sensors (TESs). In this model, a network of fluctuating resistors represents the complex dynamics inside a TES. The fluctuations can cause several resistors in series to become superconducting. Such events short out part of the TES and generate noise because much of the current percolates through low resistance paths. The model predicts that excess white noise increases with decreasing TES bias resistance (R/RN) and that perpendicular zebra stripes reduce noise and alpha of the TES by reducing percolation.

Original languageEnglish
Pages (from-to)715-717
Number of pages3
JournalNuclear Instruments and Methods in Physics Research, Section A: Accelerators, Spectrometers, Detectors and Associated Equipment
Issue number2
Publication statusPublished - Apr 14 2006
Externally publishedYes

All Science Journal Classification (ASJC) codes

  • Nuclear and High Energy Physics
  • Instrumentation


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