Partial rigid diffeomorphism for measuring temporal change of pancreatic cancer tumor

Y. Tamura, T. Yokota, M. Kugler, V. Triquet, T. Sei, C. Iwamoto, K. Ohuchida, Makoto Hashizume, H. Hontani

Research output: Chapter in Book/Report/Conference proceedingConference contribution

1 Citation (Scopus)

Abstract

The goal of our research is to describe the growth of a tumor region captured in a temporal series of MRI images. The tumor growth description requires registration of the given images in order to compensate the body deformation. It should be noted that one can apply an existing non-rigid registration technique for the compensation but it would deform the tumor region in a source image and the resultant description of the tumor growth would be inaccurate. We hence developed a Large Deformation Diffeomorphic Mapping (LDDMM) method that can non-rigidly registers given images while keeping the shape of the tumor region in a source image. The proposed method was applied to a series of MRI images of a KPC mouse and the results showed our method could successfully described the tumor growth.

Original languageEnglish
Title of host publicationInternational Workshop on Advanced Image Technology, IWAIT 2019
EditorsYung-Lyul Lee, Sanun Srisuk, Phooi Yee Lau, Lu Yu, Wen-Nung Lie, Qian Kemao, Kazuya Hayase
PublisherSPIE
ISBN (Electronic)9781510627734
DOIs
Publication statusPublished - Jan 1 2019
EventInternational Workshop on Advanced Image Technology 2019, IWAIT 2019 - Singapore, Singapore
Duration: Jan 6 2019Jan 9 2019

Publication series

NameProceedings of SPIE - The International Society for Optical Engineering
Volume11049
ISSN (Print)0277-786X
ISSN (Electronic)1996-756X

Conference

ConferenceInternational Workshop on Advanced Image Technology 2019, IWAIT 2019
Country/TerritorySingapore
CitySingapore
Period1/6/191/9/19

All Science Journal Classification (ASJC) codes

  • Electronic, Optical and Magnetic Materials
  • Condensed Matter Physics
  • Computer Science Applications
  • Applied Mathematics
  • Electrical and Electronic Engineering

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