TY - JOUR
T1 - Optical-beam-induced-current analysis of wear-out degradation in high-reliability Fabry-Perot laser diodes for access networks
AU - Ito, Tsuyoshi
AU - Takeshita, Tatsuya
AU - Sugo, Mitsuru
AU - Kurosaki, Takeshi
AU - Akatsu, Yuji
AU - Kato, Kazutoshi
PY - 2008/6/13
Y1 - 2008/6/13
N2 - Reliability of a Fabry-Perot laser diode (FP-LD) that was developed for use in the bi-directional optical subassembly of access networks was investigated. Stable operation, which was closely related to the wear-out degradation, was confirmed from the results of an accelerated aging test at 85 °C, and a lifetime of over 2 × 105 h was estimated. To examine the behavior of the wear-out degradation in the FP-LD, we employed an optical-beam-induced-current (OBIC) analysis. From the results of the OBIC analysis, we found that large degradation occurs in the SCH layer rather than in the active layer in the early stage of the FP-LD's life.
AB - Reliability of a Fabry-Perot laser diode (FP-LD) that was developed for use in the bi-directional optical subassembly of access networks was investigated. Stable operation, which was closely related to the wear-out degradation, was confirmed from the results of an accelerated aging test at 85 °C, and a lifetime of over 2 × 105 h was estimated. To examine the behavior of the wear-out degradation in the FP-LD, we employed an optical-beam-induced-current (OBIC) analysis. From the results of the OBIC analysis, we found that large degradation occurs in the SCH layer rather than in the active layer in the early stage of the FP-LD's life.
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U2 - 10.1143/JJAP.47.4523
DO - 10.1143/JJAP.47.4523
M3 - Article
AN - SCOPUS:55049113941
SN - 0021-4922
VL - 47
SP - 4523
EP - 4526
JO - Japanese journal of applied physics
JF - Japanese journal of applied physics
IS - 6 PART 1
ER -