Abstract
A new type of current access bubble propagation path for the major line of vertical Bloch line memory has been designed and processed on a standard as-grown 5 um bubble garnet film, but having the film thickness of 2.1 um. The bubble propagation path consists of a meandering conductor and high coercive force hard magnetic patterns of CoPt, providing an offset force for the bubble motion. A reasonable bias field margin (14% of mid bias field value) for the bubble propagation was measured in a test chip. The bias field compatibility between bubbles on the major line bubble propagation path and confined stripe domains for minor loop has been confirmed experimentally.
Original language | English |
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Pages (from-to) | 4248-4250 |
Number of pages | 3 |
Journal | IEEE Transactions on Magnetics |
Volume | 25 |
Issue number | 5 |
DOIs | |
Publication status | Published - Sept 1989 |
All Science Journal Classification (ASJC) codes
- Electronic, Optical and Magnetic Materials
- Electrical and Electronic Engineering