TY - JOUR
T1 - Observations of a magnetic microstructure in a co-coo obliquely evaporated tape using electron holography
AU - Tohara, Kiwamu
AU - Xia, Weixing
AU - Murakami, Yasukazu
AU - Shindo, Daisuke
AU - Ito, Takuya
AU - Iwasaki, Yoh
AU - Tachibana, Junichi
PY - 2009/1/1
Y1 - 2009/1/1
N2 - The magnetic microstructure in a Co-CoO obliquely evaporated tape that was subjected to a recording bit length of 250 nm was studied using electron holography. The reconstructed phase image demonstrated a periodic pattern of magnetic flux loops that were inclined to the film normal due to a well-developed columnar structure. When a magnetic field was applied to the tape for observing the remanent state by holography, the periodic pattern of the flux loops gradually disappeared. Interestingly, on applying a large magnetic field, the contour lines in the reconstructed phase image became approximately parallel to the longitudinal axis of the sliced tape, i.e. the contour lines were made to virtually deviate from the easy magnetization axis. The observations were supported by a computer simulation in which the effect of the stray magnetic field was considered.
AB - The magnetic microstructure in a Co-CoO obliquely evaporated tape that was subjected to a recording bit length of 250 nm was studied using electron holography. The reconstructed phase image demonstrated a periodic pattern of magnetic flux loops that were inclined to the film normal due to a well-developed columnar structure. When a magnetic field was applied to the tape for observing the remanent state by holography, the periodic pattern of the flux loops gradually disappeared. Interestingly, on applying a large magnetic field, the contour lines in the reconstructed phase image became approximately parallel to the longitudinal axis of the sliced tape, i.e. the contour lines were made to virtually deviate from the easy magnetization axis. The observations were supported by a computer simulation in which the effect of the stray magnetic field was considered.
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U2 - 10.1093/jmicro/dfn033
DO - 10.1093/jmicro/dfn033
M3 - Article
C2 - 19153102
AN - SCOPUS:67649194598
SN - 0022-0744
VL - 58
SP - 7
EP - 13
JO - Journal of Electron Microscopy
JF - Journal of Electron Microscopy
IS - 1
ER -