Multilayer mirror soft x-ray spectrometer for fast electron temperature measurement on the compact helical system

S. Lee; S. Duorah; A. Ejiri; H. Iguchi; A. Fujisawa; E. Ishiyama; Y. Takase; H. Toyama; M. Aramaki; M. Kojima; S. Okamura; K. Matsuoka

doi:10.1063/1.1150517

Multilayer mirror soft x-ray spectrometer for fast electron temperature measurement on the compact helical system

S. Lee, S. Duorah, A. Ejiri, H. Iguchi, A. Fujisawa, E. Ishiyama, Y. Takase, H. Toyama, M. Aramaki, M. Kojima, S. Okamura, K. Matsuoka

Research output: Contribution to journal › Article › peer-review

Abstract

A multilayer mirror (MLM) soft x-ray spectrometer has been installed on the Compact Helical System. The x-ray energy spectrum from ECH and neutral beam injected heated low beta plasmas was measured as a function of radiation energy. Modulations of the x-ray intensity associated with magnetohydrodynamic instability were observed. The electron temperature measurement was also investigated using the MLM x-ray spectrometer. The data suggest the possibility of a fluctuation measurement of the electron temperature T_e with fast time resolution using the MLM spectrometer.

Original language	English
Pages (from-to)	1671-1674
Number of pages	4
Journal	Review of Scientific Instruments
Volume	71
Issue number	4
DOIs	https://doi.org/10.1063/1.1150517
Publication status	Published - Apr 2000
Externally published	Yes

All Science Journal Classification (ASJC) codes

Instrumentation

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10.1063/1.1150517

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title = "Multilayer mirror soft x-ray spectrometer for fast electron temperature measurement on the compact helical system",

abstract = "A multilayer mirror (MLM) soft x-ray spectrometer has been installed on the Compact Helical System. The x-ray energy spectrum from ECH and neutral beam injected heated low beta plasmas was measured as a function of radiation energy. Modulations of the x-ray intensity associated with magnetohydrodynamic instability were observed. The electron temperature measurement was also investigated using the MLM x-ray spectrometer. The data suggest the possibility of a fluctuation measurement of the electron temperature Te with fast time resolution using the MLM spectrometer.",

author = "S. Lee and S. Duorah and A. Ejiri and H. Iguchi and A. Fujisawa and E. Ishiyama and Y. Takase and H. Toyama and M. Aramaki and M. Kojima and S. Okamura and K. Matsuoka",

year = "2000",

month = apr,

doi = "10.1063/1.1150517",

language = "English",

volume = "71",

pages = "1671--1674",

journal = "Review of Scientific Instruments",

issn = "0034-6748",

publisher = "American Institute of Physics Publising LLC",

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TY - JOUR

T1 - Multilayer mirror soft x-ray spectrometer for fast electron temperature measurement on the compact helical system

AU - Lee, S.

AU - Duorah, S.

AU - Ejiri, A.

AU - Iguchi, H.

AU - Fujisawa, A.

AU - Ishiyama, E.

AU - Takase, Y.

AU - Toyama, H.

AU - Aramaki, M.

AU - Kojima, M.

AU - Okamura, S.

AU - Matsuoka, K.

PY - 2000/4

Y1 - 2000/4

N2 - A multilayer mirror (MLM) soft x-ray spectrometer has been installed on the Compact Helical System. The x-ray energy spectrum from ECH and neutral beam injected heated low beta plasmas was measured as a function of radiation energy. Modulations of the x-ray intensity associated with magnetohydrodynamic instability were observed. The electron temperature measurement was also investigated using the MLM x-ray spectrometer. The data suggest the possibility of a fluctuation measurement of the electron temperature Te with fast time resolution using the MLM spectrometer.

AB - A multilayer mirror (MLM) soft x-ray spectrometer has been installed on the Compact Helical System. The x-ray energy spectrum from ECH and neutral beam injected heated low beta plasmas was measured as a function of radiation energy. Modulations of the x-ray intensity associated with magnetohydrodynamic instability were observed. The electron temperature measurement was also investigated using the MLM x-ray spectrometer. The data suggest the possibility of a fluctuation measurement of the electron temperature Te with fast time resolution using the MLM spectrometer.

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DO - 10.1063/1.1150517

M3 - Article

AN - SCOPUS:0347741753

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JO - Review of Scientific Instruments

JF - Review of Scientific Instruments

IS - 4

ER -

Multilayer mirror soft x-ray spectrometer for fast electron temperature measurement on the compact helical system

Abstract

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