Multi-scale Monte Carlo simulation of soft errors using PHITS-HyENEXSS code system

Shin Ichiro Abe; Yukinobu Watanabe; Nozomi Shibano; Nobuyuki Sano; Hiroshi Furuta; Masafumi Tsutsui; Taiki Uemura; Takahiko Arakawa

doi:10.1109/RADECS.2011.6131413

Multi-scale Monte Carlo simulation of soft errors using PHITS-HyENEXSS code system

Shin Ichiro Abe, Yukinobu Watanabe, Nozomi Shibano, Nobuyuki Sano, Hiroshi Furuta, Masafumi Tsutsui, Taiki Uemura, Takahiko Arakawa

Engineering Science for Advanced energy system

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution

3 Citations (Scopus)

Abstract

We have proposed a multi-scale Monte Carlo simulation method of neutron induced soft errors by linking a particle transport code PHITS and a 3-D TCAD simulator HyENEXSS. An interface tool between PHITS and HyENEXSS is developed to generate the mesh structure optimized for an event where multiple secondary ions extending to arbitrary directions are generated simultaneously by neutron incidence on device. Using the interface tool, we have made it possible to perform the Monte Carlo calculation of soft error rates (SERs) based on event-by-event device simulation. The PHITS-HyENEXSS code system has been successfully applied to SER analyses for 65 nm, 45 nm, and 32 nm technology MOSFETs.

Original language	English
Title of host publication	RADECS 2011 - 12th European Conference on Radiation and Its Effects on Component and Systems, Conference Proceedings
Pages	390-395
Number of pages	6
DOIs	https://doi.org/10.1109/RADECS.2011.6131413
Publication status	Published - 2011
Event	12th European Conference on Radiation and Its Effects on Component and Systems, RADECS 2011 - Sevilla, Spain Duration: Sept 19 2011 → Sept 23 2011

Publication series

Name	Proceedings of the European Conference on Radiation and its Effects on Components and Systems, RADECS

Other

Other	12th European Conference on Radiation and Its Effects on Component and Systems, RADECS 2011
Country/Territory	Spain
City	Sevilla
Period	9/19/11 → 9/23/11

All Science Journal Classification (ASJC) codes

Radiation
Electrical and Electronic Engineering

Access to Document

10.1109/RADECS.2011.6131413

Cite this

Abe, S. I., Watanabe, Y., Shibano, N., Sano, N., Furuta, H., Tsutsui, M., Uemura, T., & Arakawa, T. (2011). Multi-scale Monte Carlo simulation of soft errors using PHITS-HyENEXSS code system. In RADECS 2011 - 12th European Conference on Radiation and Its Effects on Component and Systems, Conference Proceedings (pp. 390-395). Article 6131413 (Proceedings of the European Conference on Radiation and its Effects on Components and Systems, RADECS). https://doi.org/10.1109/RADECS.2011.6131413

Multi-scale Monte Carlo simulation of soft errors using PHITS-HyENEXSS code system. / Abe, Shin Ichiro; Watanabe, Yukinobu; Shibano, Nozomi et al.
RADECS 2011 - 12th European Conference on Radiation and Its Effects on Component and Systems, Conference Proceedings. 2011. p. 390-395 6131413 (Proceedings of the European Conference on Radiation and its Effects on Components and Systems, RADECS).

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution

Abe, SI, Watanabe, Y, Shibano, N, Sano, N, Furuta, H, Tsutsui, M, Uemura, T & Arakawa, T 2011, Multi-scale Monte Carlo simulation of soft errors using PHITS-HyENEXSS code system. in RADECS 2011 - 12th European Conference on Radiation and Its Effects on Component and Systems, Conference Proceedings., 6131413, Proceedings of the European Conference on Radiation and its Effects on Components and Systems, RADECS, pp. 390-395, 12th European Conference on Radiation and Its Effects on Component and Systems, RADECS 2011, Sevilla, Spain, 9/19/11. https://doi.org/10.1109/RADECS.2011.6131413

Abe SI, Watanabe Y, Shibano N, Sano N, Furuta H, Tsutsui M et al. Multi-scale Monte Carlo simulation of soft errors using PHITS-HyENEXSS code system. In RADECS 2011 - 12th European Conference on Radiation and Its Effects on Component and Systems, Conference Proceedings. 2011. p. 390-395. 6131413. (Proceedings of the European Conference on Radiation and its Effects on Components and Systems, RADECS). doi: 10.1109/RADECS.2011.6131413

Abe, Shin Ichiro ; Watanabe, Yukinobu ; Shibano, Nozomi et al. / Multi-scale Monte Carlo simulation of soft errors using PHITS-HyENEXSS code system. RADECS 2011 - 12th European Conference on Radiation and Its Effects on Component and Systems, Conference Proceedings. 2011. pp. 390-395 (Proceedings of the European Conference on Radiation and its Effects on Components and Systems, RADECS).

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abstract = "We have proposed a multi-scale Monte Carlo simulation method of neutron induced soft errors by linking a particle transport code PHITS and a 3-D TCAD simulator HyENEXSS. An interface tool between PHITS and HyENEXSS is developed to generate the mesh structure optimized for an event where multiple secondary ions extending to arbitrary directions are generated simultaneously by neutron incidence on device. Using the interface tool, we have made it possible to perform the Monte Carlo calculation of soft error rates (SERs) based on event-by-event device simulation. The PHITS-HyENEXSS code system has been successfully applied to SER analyses for 65 nm, 45 nm, and 32 nm technology MOSFETs.",

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AU - Abe, Shin Ichiro

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AU - Shibano, Nozomi

AU - Sano, Nobuyuki

AU - Furuta, Hiroshi

AU - Tsutsui, Masafumi

AU - Uemura, Taiki

AU - Arakawa, Takahiko

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AB - We have proposed a multi-scale Monte Carlo simulation method of neutron induced soft errors by linking a particle transport code PHITS and a 3-D TCAD simulator HyENEXSS. An interface tool between PHITS and HyENEXSS is developed to generate the mesh structure optimized for an event where multiple secondary ions extending to arbitrary directions are generated simultaneously by neutron incidence on device. Using the interface tool, we have made it possible to perform the Monte Carlo calculation of soft error rates (SERs) based on event-by-event device simulation. The PHITS-HyENEXSS code system has been successfully applied to SER analyses for 65 nm, 45 nm, and 32 nm technology MOSFETs.

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Multi-scale Monte Carlo simulation of soft errors using PHITS-HyENEXSS code system

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