TY - JOUR
T1 - Multi-layer stacking scheme of sol-gel based SiO2 towards thicker (>0.8 µm) cladding layers for optical waveguides
AU - Idris, Ahmad Syahrin
AU - Jiang, Haisong
AU - Hamamoto, Kiichi
N1 - Publisher Copyright:
© IEICE 2018.
Copyright:
Copyright 2020 Elsevier B.V., All rights reserved.
PY - 2018/10/10
Y1 - 2018/10/10
N2 - A multi-layer stacking scheme using a sol-gel SiO2 fabrication technique was developed towards stacking thick layers of >0.8 µm for cladding and passivation layers of optical waveguides. The multi-layer stacking scheme, which improves the intrinsic stress problem especially in case of thick layer stacking, enables a >0.8 µm sol-gel SiO2 thickness without cracking and peeling issues. As a result, thick layer of 3.5 µm with high surface resistivity of >6.6 × 1013 Ω/m was obtained. Furthermore, a-Si/SiO2 waveguide (cladding thickness: 1.9 µm) was realized to confirm the fundamental potential as a cladding layer.
AB - A multi-layer stacking scheme using a sol-gel SiO2 fabrication technique was developed towards stacking thick layers of >0.8 µm for cladding and passivation layers of optical waveguides. The multi-layer stacking scheme, which improves the intrinsic stress problem especially in case of thick layer stacking, enables a >0.8 µm sol-gel SiO2 thickness without cracking and peeling issues. As a result, thick layer of 3.5 µm with high surface resistivity of >6.6 × 1013 Ω/m was obtained. Furthermore, a-Si/SiO2 waveguide (cladding thickness: 1.9 µm) was realized to confirm the fundamental potential as a cladding layer.
UR - http://www.scopus.com/inward/record.url?scp=85060958750&partnerID=8YFLogxK
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U2 - 10.1587/elex.15.20180783
DO - 10.1587/elex.15.20180783
M3 - Article
AN - SCOPUS:85060958750
SN - 1349-2543
VL - 15
JO - IEICE Electronics Express
JF - IEICE Electronics Express
IS - 19
M1 - 20180783
ER -