Molecular aggregation structure of polyethylene thin films prepared on silicon substrates

Sono Sasaki, Hirohiko Yakabe, Keiji Tanaka, Toshihiko Nagamura, Osami Sakata, Masaki Takata, Atsushi Takahara, Tisato Kajiyama

Research output: Contribution to conferencePaperpeer-review


In this study, structural features of crystalline polymers at the solid surface were analyzed by synchrotron grazing-incidence X-ray diffraction (SR-GIXD) measurements. Thin films of high-density polyethylene (HDPE) were prepared on silicon substrates from a p-xylene solution by a dip-coating method. The dip-coated films and the dip-coated and melt-crystallized ones were annealed at temperatures (Ta) of 373K-393K under N 2 atmosphere. The in-plane GIXD measurement for the HDPE thin films was carried out at the BL13XU of SPring-8, Japan. Bragg diffraction from the near-surface and the bulk of the films was detected at incident angles smaller and larger than the critical angle, respectively. Comparison of the surface-sensitive GIXD data with the bulk one revealed that the dimensions of orthorhombic unit cell in the near-surface region were smaller than those in the bulk region. This might relate to thermal stress induced between the HDPE film and the silicon substrate in film preparation.

Original languageEnglish
Number of pages2
Publication statusPublished - 2005
Event54th SPSJ Symposium on Macromolecules - Yamagata, Japan
Duration: Sept 20 2005Sept 22 2005


Other54th SPSJ Symposium on Macromolecules

All Science Journal Classification (ASJC) codes

  • General Engineering


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