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Microstructure and field angle dependence of critical current densities in REBa 2Cu 3O y thin films prepared by PLD method
Y. Ichino, R. Honda, M. Miura, M. Itoh, Y. Yoshida, Y. Takai, K. Matsumoto, M. Mukaida, A. Ichinose, S. Horii
Research output: Contribution to journal › Article › peer-review
3
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(Scopus)