Measurements of Debye-Waller factors in TiAl from energy-filtered HOLZ line intensities

R. Holmestad; A. L. Weickenmeier; J. M. Zuo; J. C H Spence; Zenji Horita

Measurements of Debye-Waller factors in TiAl from energy-filtered HOLZ line intensities

R. Holmestad, A. L. Weickenmeier, J. M. Zuo, J. C H Spence, Zenji Horita

Research output: Contribution to journal › Article › peer-review

Abstract

A new method to measure Debye Waller factors is reported in this article. The specimen analyzed is TiAl which was thinned by twin jet electropolishing. The measurement of the factors is necessary for the structure factor refinement in TiAl. It is aimed to get CBED pattern near a sparse zone axis, to extract line scans along HOLZ lines from the pattern. Two beam intensity is calculated to fit experiment and simulation by Debye Waller factor variations.

Original language	English
Pages (from-to)	698-699
Number of pages	2
Journal	Unknown Journal
Publication status	Published - 1993
Externally published	Yes

All Science Journal Classification (ASJC) codes

Engineering(all)

Cite this

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title = "Measurements of Debye-Waller factors in TiAl from energy-filtered HOLZ line intensities",

abstract = "A new method to measure Debye Waller factors is reported in this article. The specimen analyzed is TiAl which was thinned by twin jet electropolishing. The measurement of the factors is necessary for the structure factor refinement in TiAl. It is aimed to get CBED pattern near a sparse zone axis, to extract line scans along HOLZ lines from the pattern. Two beam intensity is calculated to fit experiment and simulation by Debye Waller factor variations.",

author = "R. Holmestad and Weickenmeier, {A. L.} and Zuo, {J. M.} and Spence, {J. C H} and Zenji Horita",

year = "1993",

language = "English",

pages = "698--699",

journal = "Unknown Journal",

publisher = "Elsevier Limited",

}

TY - JOUR

T1 - Measurements of Debye-Waller factors in TiAl from energy-filtered HOLZ line intensities

AU - Holmestad, R.

AU - Weickenmeier, A. L.

AU - Zuo, J. M.

AU - Spence, J. C H

AU - Horita, Zenji

PY - 1993

Y1 - 1993

N2 - A new method to measure Debye Waller factors is reported in this article. The specimen analyzed is TiAl which was thinned by twin jet electropolishing. The measurement of the factors is necessary for the structure factor refinement in TiAl. It is aimed to get CBED pattern near a sparse zone axis, to extract line scans along HOLZ lines from the pattern. Two beam intensity is calculated to fit experiment and simulation by Debye Waller factor variations.

AB - A new method to measure Debye Waller factors is reported in this article. The specimen analyzed is TiAl which was thinned by twin jet electropolishing. The measurement of the factors is necessary for the structure factor refinement in TiAl. It is aimed to get CBED pattern near a sparse zone axis, to extract line scans along HOLZ lines from the pattern. Two beam intensity is calculated to fit experiment and simulation by Debye Waller factor variations.

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M3 - Article

AN - SCOPUS:0027705551

SP - 698

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JO - Unknown Journal

JF - Unknown Journal

ER -

Measurements of Debye-Waller factors in TiAl from energy-filtered HOLZ line intensities

Abstract

All Science Journal Classification (ASJC) codes

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