Abstract
High-quality Fe3O4 thin films have been fabricated onto metallic underlayers of Cr/Cu and Al by rf-magnetron sputtering at low substrate temperatures (< 573 K). The measured saturation magnetizations Ms are 462 emu/cm3 for Al (50 nm)/Fe3O 4 (200 nm) and 422 emu/cm3 for Cr (45nm)/Cu (300nm)/Fe3O4 (200nm), which are markedly enhanced compared with that for the reference sample deposited directly on a glass substrate, and practically comparable to the bulk value of 477emu/cm 3. Highly conductive transport with an order-disorder change of the Verwey transition was observed in the current-perpendicular-to-plane geometry. The order of decrease in coercive field was achieved by exchange coupling with an overlaid NiFe layer.
Original language | English |
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Pages (from-to) | 189-192 |
Number of pages | 4 |
Journal | IEICE Transactions on Electronics |
Volume | E87-C |
Issue number | 2 |
Publication status | Published - Feb 2004 |
All Science Journal Classification (ASJC) codes
- Electrical and Electronic Engineering