TY - JOUR
T1 - Line tension and its influence on droplets and particles at surfaces
AU - Law, Bruce M.
AU - McBride, Sean P.
AU - Wang, Jiang Yong
AU - Wi, Haeng Sub
AU - Paneru, Govind
AU - Betelu, Santigo
AU - Ushijima, Baku
AU - Takata, Youichi
AU - Flanders, Bret
AU - Bresme, Fernando
AU - Matsubara, Hiroki
AU - Takiue, Takanori
AU - Aratono, Makoto
N1 - Publisher Copyright:
© 2016 Elsevier Ltd
PY - 2017/2/1
Y1 - 2017/2/1
N2 - In this review we examine the influence of the line tension τ on droplets and particles at surfaces. The line tension influences the nucleation behavior and contact angle of liquid droplets at both liquid and solid surfaces and alters the attachment energetics of solid particles to liquid surfaces. Many factors, occurring over a wide range of length scales, contribute to the line tension. On atomic scales, atomic rearrangements and reorientations of submolecular components give rise to an atomic line tension contribution τatom (∼1 nN), which depends on the similarity/dissimilarity of the droplet/particle surface composition compared with the surface upon which it resides. At nanometer length scales, an integration over the van der Waals interfacial potential gives rise to a mesoscale contribution |τvdW| ∼ 1–100 pN while, at millimeter length scales, the gravitational potential provides a gravitational contribution τgrav ∼ +1–10 μN. τgrav is always positive, whereas, τvdW can have either sign. Near wetting, for very small contact angle droplets, a negative line tension may give rise to a contact line instability. We examine these and other issues in this review.
AB - In this review we examine the influence of the line tension τ on droplets and particles at surfaces. The line tension influences the nucleation behavior and contact angle of liquid droplets at both liquid and solid surfaces and alters the attachment energetics of solid particles to liquid surfaces. Many factors, occurring over a wide range of length scales, contribute to the line tension. On atomic scales, atomic rearrangements and reorientations of submolecular components give rise to an atomic line tension contribution τatom (∼1 nN), which depends on the similarity/dissimilarity of the droplet/particle surface composition compared with the surface upon which it resides. At nanometer length scales, an integration over the van der Waals interfacial potential gives rise to a mesoscale contribution |τvdW| ∼ 1–100 pN while, at millimeter length scales, the gravitational potential provides a gravitational contribution τgrav ∼ +1–10 μN. τgrav is always positive, whereas, τvdW can have either sign. Near wetting, for very small contact angle droplets, a negative line tension may give rise to a contact line instability. We examine these and other issues in this review.
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U2 - 10.1016/j.progsurf.2016.12.002
DO - 10.1016/j.progsurf.2016.12.002
M3 - Review article
AN - SCOPUS:85008158252
SN - 0079-6816
VL - 92
SP - 1
EP - 39
JO - Progress in Surface Science
JF - Progress in Surface Science
IS - 1
ER -