TY - GEN
T1 - Light output response of GSO(Ce) crystals to relativistic carbon ions
AU - Wakabayashi, Genichiro
AU - Koba, Yusuke
AU - Imamura, Minoru
AU - Uozumi, Yusuke
AU - Koba, Naoya
AU - Shimazu, Takuro
AU - Kaneko, Motohisa
AU - Ohkawa, Hitoshi
AU - Ikeda, Nobuo
AU - Kin, Tadahiro
AU - Matsufuji, Naruhiro
PY - 2006/1/1
Y1 - 2006/1/1
N2 - We have investigated the light output response of a GSO(Ce) crystal to carbon ions of energy up to 3.34 GeV. An experiment was carried out with HIMAC at National Institute of Radiological Sciences in Chiba, Japan. The incident energy of carbon beam was changed by inserting target materials with different thicknesses as degraders. Experimental results were consistent with the calculated curve by Birks equation, and the light output plotted as a function of deposited energy in the GSO(Ce) crystal showed a slight non-linearity in the low energy region and a good linearity in the higher energy region above around 1.5 GeV.
AB - We have investigated the light output response of a GSO(Ce) crystal to carbon ions of energy up to 3.34 GeV. An experiment was carried out with HIMAC at National Institute of Radiological Sciences in Chiba, Japan. The incident energy of carbon beam was changed by inserting target materials with different thicknesses as degraders. Experimental results were consistent with the calculated curve by Birks equation, and the light output plotted as a function of deposited energy in the GSO(Ce) crystal showed a slight non-linearity in the low energy region and a good linearity in the higher energy region above around 1.5 GeV.
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U2 - 10.1109/NSSMIC.2006.356053
DO - 10.1109/NSSMIC.2006.356053
M3 - Conference contribution
SN - 1424405610
SN - 9781424405619
T3 - IEEE Nuclear Science Symposium Conference Record
SP - 1175
EP - 1177
BT - 2006 IEEE Nuclear Science Symposium - Conference Record
PB - Institute of Electrical and Electronics Engineers Inc.
T2 - 2006 IEEE Nuclear Science Symposium, Medical Imaging Conference and 15th International Workshop on Room-Temperature Semiconductor X- and Gamma-Ray Detectors, Special Focus Workshops, NSS/MIC/RTSD
Y2 - 29 October 2006 through 4 November 2006
ER -