Joule heat-induced breakdown of organic thin-film devices under pulse operation

Kou Yoshida, Toshinori Matsushima, Yu Shiihara, Hiroyuki Kuwae, Jun Mizuno, Chihaya Adachi

Research output: Contribution to journalArticlepeer-review

12 Citations (Scopus)


We investigated the influence of the substrate's thermal conductivities (k) and the widths of the electrical pulses (τpulse) on the maximum current densities (Jmax) in organic thin-film devices. We also estimated the temperature rise (ΔT) inside devices under the pulse operation using numerical calculations to interpret the observed differences in Jmax. For a long τpulse of 5 μs, Jmax is higher for devices with high-k sapphire substrates (around 1.2 kA/cm2) than devices with low-k plastic substrates (around 0.4 kA/cm2). This is because high-k sapphire substrates can work as heat sinks to relax ΔT for such a long τpulse. Operation of devices with high-k sapphire substrates for a short τpulse of 70 ns resulted in further relaxation of ΔT, leading to an increase of Jmax to around 5 kA/cm2. Interestingly, for such a short τpulse, devices with high-k sapphire and low-k plastic substrates showed similar Jmax and ΔT values, the reason for which may be that it is difficult for the generated Joule heat to travel to the substrate across a low-k organic layer within this short time.

Original languageEnglish
Article number195503
JournalJournal of Applied Physics
Issue number19
Publication statusPublished - May 21 2017

All Science Journal Classification (ASJC) codes

  • Physics and Astronomy(all)


Dive into the research topics of 'Joule heat-induced breakdown of organic thin-film devices under pulse operation'. Together they form a unique fingerprint.

Cite this