TY - JOUR
T1 - Ion beam channeling study on the damage accumulation in yttria-stabilized cubic zirconia
AU - Yasuda, Kazuhiro
AU - Nastasi, Michael
AU - Sickafus, Kurt E.
AU - Maggiore, Carl J.
AU - Yu, Ning
N1 - Funding Information:
All the ion beame xperimentws ere carried out at Ion BeamM aterialsL aboratory of Los Alamos National Laboratory. The authorsa re gratefult o Mark G. Hollander, Caleb R. Evans and Joseph R. Tesmer for their technicala ssistancefo r the ion beamw ork. One of the authors( KY) was supported in part by the Ministry of Education,S ci-ence, Sports and Culture in Japan for his researchs tay at LANL.
PY - 1998/3
Y1 - 1998/3
N2 - The lattice damage kinetics of defect accumulation in ion irradiated yttria-stabilized cubic zirconia (YSZ) was investigated by using in situ Rutherford backscattering spectrometry and channeling (RBS/C) techniques. The samples of single crystalline YSZ were irradiated with 400 keV Xe++ ions over a range of doses and for sample temperatures of 170 and 300 K. Under all irradiation conditions studied, the samples remained crystalline. However, lattice damage, as measured by the minimum yield, χmin, was observed to have three distinct stages (stages I-III) in the rate of accumulation. Energy dependent channeling experiments revealed -1 and 1/2 power dependence for the dechanneling parameter in stage I and stage III, respectively. Corresponding transmission electron microscopy (TEM) studies detected defects which appear as tiny dot contrasts in stage I samples, ultimately leading to the overlaps of dislocations at stage III. The three stages of damage accumulations have been interpreted as an evolving defect structure which changes the dominant RBS/C ion scattering process from direct scattering to dechanneling. A comparison between RBS/C and TEM techniques has also been made for the effective use of in situ RBS/C techniques for the study of radiation damage.
AB - The lattice damage kinetics of defect accumulation in ion irradiated yttria-stabilized cubic zirconia (YSZ) was investigated by using in situ Rutherford backscattering spectrometry and channeling (RBS/C) techniques. The samples of single crystalline YSZ were irradiated with 400 keV Xe++ ions over a range of doses and for sample temperatures of 170 and 300 K. Under all irradiation conditions studied, the samples remained crystalline. However, lattice damage, as measured by the minimum yield, χmin, was observed to have three distinct stages (stages I-III) in the rate of accumulation. Energy dependent channeling experiments revealed -1 and 1/2 power dependence for the dechanneling parameter in stage I and stage III, respectively. Corresponding transmission electron microscopy (TEM) studies detected defects which appear as tiny dot contrasts in stage I samples, ultimately leading to the overlaps of dislocations at stage III. The three stages of damage accumulations have been interpreted as an evolving defect structure which changes the dominant RBS/C ion scattering process from direct scattering to dechanneling. A comparison between RBS/C and TEM techniques has also been made for the effective use of in situ RBS/C techniques for the study of radiation damage.
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U2 - 10.1016/S0168-583X(97)00898-7
DO - 10.1016/S0168-583X(97)00898-7
M3 - Article
AN - SCOPUS:0032018706
SN - 0168-583X
VL - 136-138
SP - 499
EP - 504
JO - Nuclear Instruments and Methods in Physics Research, Section B: Beam Interactions with Materials and Atoms
JF - Nuclear Instruments and Methods in Physics Research, Section B: Beam Interactions with Materials and Atoms
ER -