Investigations of Pressure and Temperature Effects on Gelation Process of Egg White by Time-Resolved Turbidimetric Measurements

Haruichi Kanaya; Kazuhiro Hara; Atsushi Nakamura; Nobuyasu Hiramatsu; Kazumi Matsushige

Investigations of Pressure and Temperature Effects on Gelation Process of Egg White by Time-Resolved Turbidimetric Measurements

Translated title of the contribution: Investigations of Pressure and Temperature Effects on Gelation Process of Egg White by Time-Resolved Turbidimetric Measurements

Haruichi Kanaya, Kazuhiro Hara, Atsushi Nakamura, Nobuyasu Hiramatsu, Kazumi Matsushige

Research output: Contribution to journal › Article › peer-review

Translated title of the contribution	Investigations of Pressure and Temperature Effects on Gelation Process of Egg White by Time-Resolved Turbidimetric Measurements
Original language	Undefined/Unknown
Pages (from-to)	2817-2820
Number of pages	4
Journal	Japanese Journal of Applied Physics, Part 2: Letters
Volume	33
Issue number	1
Publication status	Published - May 15 1994

Access to Document

http://dx.doi.org/10.1143/jjap.33.2817

Cite this

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title = "Investigations of Pressure and Temperature Effects on Gelation Process of Egg White by Time-Resolved Turbidimetric Measurements",

author = "Haruichi Kanaya and Kazuhiro Hara and Atsushi Nakamura and Nobuyasu Hiramatsu and Kazumi Matsushige",

year = "1994",

month = may,

day = "15",

language = "未定義/不明",

volume = "33",

pages = "2817--2820",

journal = "Japanese Journal of Applied Physics, Part 2: Letters",

issn = "0021-4922",

publisher = "IOP Publishing Ltd.",

number = "1",

}

TY - JOUR

T1 - Investigations of Pressure and Temperature Effects on Gelation Process of Egg White by Time-Resolved Turbidimetric Measurements

AU - Kanaya, Haruichi

AU - Hara, Kazuhiro

AU - Nakamura, Atsushi

AU - Hiramatsu, Nobuyasu

AU - Matsushige, Kazumi

PY - 1994/5/15

Y1 - 1994/5/15

M3 - 学術誌

SN - 0021-4922

VL - 33

SP - 2817

EP - 2820

JO - Japanese Journal of Applied Physics, Part 2: Letters

JF - Japanese Journal of Applied Physics, Part 2: Letters

IS - 1

ER -