TY - JOUR
T1 - Interference of the surface plasmon polaritons with an Ag waveguide probed by dual-probe scanning near-field optical microscopy
AU - Fujimoto, R.
AU - Kaneta, A.
AU - Okamoto, K.
AU - Funato, M.
AU - Kawakami, Y.
N1 - Funding Information:
Part of this study was supported by a Grant-in-Aid for Scientific Research from the Japan Society for the Promotion of Science . One of the authors (K.O.) acknowledges support from JST PRESTO.
PY - 2012/7/15
Y1 - 2012/7/15
N2 - The propagation of surface plasmon polaritons (SPPs) on Ag waveguides with two different widths is directly observed using dual-probe scanning near-field optical microscopy (DSNOM). We find that the waveguide structure strongly affects the propagation of locally excited SPPs. SPPs in a flat plane structure spread radially, whereas SPPs in a 3.4-μm wide waveguide structure form two-dimensional interference fringes due to the multiple reflections at the side edges. The experimental results agree well with finite-difference time-domain calculations. The results suggest that the DSNOM technique can visualize the nanoscale characteristics of the SPP waves in various plasmonic waveguides.
AB - The propagation of surface plasmon polaritons (SPPs) on Ag waveguides with two different widths is directly observed using dual-probe scanning near-field optical microscopy (DSNOM). We find that the waveguide structure strongly affects the propagation of locally excited SPPs. SPPs in a flat plane structure spread radially, whereas SPPs in a 3.4-μm wide waveguide structure form two-dimensional interference fringes due to the multiple reflections at the side edges. The experimental results agree well with finite-difference time-domain calculations. The results suggest that the DSNOM technique can visualize the nanoscale characteristics of the SPP waves in various plasmonic waveguides.
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U2 - 10.1016/j.apsusc.2012.04.034
DO - 10.1016/j.apsusc.2012.04.034
M3 - Article
AN - SCOPUS:84861347800
SN - 0169-4332
VL - 258
SP - 7372
EP - 7376
JO - Applied Surface Science
JF - Applied Surface Science
IS - 19
ER -