Inhomogeneous electronic structure of copper phthalocyanine film measured with microspot photoemission spectroscopy

T. Munakata; T. Sugiyama; T. Masuda; M. Aida; N. Ueno

doi:10.1063/1.1808494

Inhomogeneous electronic structure of copper phthalocyanine film measured with microspot photoemission spectroscopy

T. Munakata, T. Sugiyama, T. Masuda, M. Aida, N. Ueno

Research output: Contribution to journal › Article › peer-review

27 Citations (Scopus)

Abstract

We have applied photoemission microspectroscopy to copper phthalocyanine film grown on a polycrystalline copper with a lateral resolution of 0.3 μm and an energy resolution of 30 meV. The photoemission band due to the highest occupied molecular orbital peaked at the binding energy of either 1.6 or 1.2 eV depending on the sample positions, while the work functions were 4.3 and 4.5 eV for the respective positions. The band was intense when the binding energy was low. The results demonstrate that a large inhomogeneity exists in the interface electronic structure.

Original language	English
Pages (from-to)	3584-3586
Number of pages	3
Journal	Applied Physics Letters
Volume	85
Issue number	16
DOIs	https://doi.org/10.1063/1.1808494
Publication status	Published - Oct 18 2004
Externally published	Yes

All Science Journal Classification (ASJC) codes

Physics and Astronomy (miscellaneous)

Access to Document

10.1063/1.1808494

Cite this

@article{689f381e57e845679c493830d24f95ae,

title = "Inhomogeneous electronic structure of copper phthalocyanine film measured with microspot photoemission spectroscopy",

abstract = "We have applied photoemission microspectroscopy to copper phthalocyanine film grown on a polycrystalline copper with a lateral resolution of 0.3 μm and an energy resolution of 30 meV. The photoemission band due to the highest occupied molecular orbital peaked at the binding energy of either 1.6 or 1.2 eV depending on the sample positions, while the work functions were 4.3 and 4.5 eV for the respective positions. The band was intense when the binding energy was low. The results demonstrate that a large inhomogeneity exists in the interface electronic structure.",

author = "T. Munakata and T. Sugiyama and T. Masuda and M. Aida and N. Ueno",

note = "Funding Information: This work was in part supported by the Special Coordination Funds of Ministry of Education, Culture, Sports, Science and Technology of the Japanese Government, and Grant-in-Aid for Creative Scientific Research from the Japan Society for the Promotion of Science (Grant No. 14GS0213).",

year = "2004",

month = oct,

day = "18",

doi = "10.1063/1.1808494",

language = "English",

volume = "85",

pages = "3584--3586",

journal = "Applied Physics Letters",

issn = "0003-6951",

publisher = "American Institute of Physics Publising LLC",

number = "16",

}

TY - JOUR

T1 - Inhomogeneous electronic structure of copper phthalocyanine film measured with microspot photoemission spectroscopy

AU - Munakata, T.

AU - Sugiyama, T.

AU - Masuda, T.

AU - Aida, M.

AU - Ueno, N.

N1 - Funding Information: This work was in part supported by the Special Coordination Funds of Ministry of Education, Culture, Sports, Science and Technology of the Japanese Government, and Grant-in-Aid for Creative Scientific Research from the Japan Society for the Promotion of Science (Grant No. 14GS0213).

PY - 2004/10/18

Y1 - 2004/10/18

N2 - We have applied photoemission microspectroscopy to copper phthalocyanine film grown on a polycrystalline copper with a lateral resolution of 0.3 μm and an energy resolution of 30 meV. The photoemission band due to the highest occupied molecular orbital peaked at the binding energy of either 1.6 or 1.2 eV depending on the sample positions, while the work functions were 4.3 and 4.5 eV for the respective positions. The band was intense when the binding energy was low. The results demonstrate that a large inhomogeneity exists in the interface electronic structure.

AB - We have applied photoemission microspectroscopy to copper phthalocyanine film grown on a polycrystalline copper with a lateral resolution of 0.3 μm and an energy resolution of 30 meV. The photoemission band due to the highest occupied molecular orbital peaked at the binding energy of either 1.6 or 1.2 eV depending on the sample positions, while the work functions were 4.3 and 4.5 eV for the respective positions. The band was intense when the binding energy was low. The results demonstrate that a large inhomogeneity exists in the interface electronic structure.

UR - http://www.scopus.com/inward/record.url?scp=9744227962&partnerID=8YFLogxK

UR - http://www.scopus.com/inward/citedby.url?scp=9744227962&partnerID=8YFLogxK

U2 - 10.1063/1.1808494

DO - 10.1063/1.1808494

M3 - Article

AN - SCOPUS:9744227962

SN - 0003-6951

VL - 85

SP - 3584

EP - 3586

JO - Applied Physics Letters

JF - Applied Physics Letters

IS - 16

ER -

Inhomogeneous electronic structure of copper phthalocyanine film measured with microspot photoemission spectroscopy

Abstract

All Science Journal Classification (ASJC) codes

Access to Document

Other files and links

Fingerprint

Cite this