TY - JOUR
T1 - Infrared plasmonics via ZnO
AU - Allen, J. W.
AU - Allen, M. S.
AU - Look, D. C.
AU - Wenner, B. R.
AU - Itagaki, N.
AU - Matsushima, K.
AU - Surhariadi, I.
PY - 2014/7/6
Y1 - 2014/7/6
N2 - Conventional plasmonic devices involve metals, but metal-based plasmonic resonances are mainly limited to λres < 1 μm, and thus metals interact effectively only with light in the UV and visible ranges. We show that highly doped ZnO can exhibit λres ≥ 1 μm, thus moving plasmonics into the IR range. We illustrate this capability with a set of thin (d = 25-147 nm) Al-doped ZnO (AZO) layers grown by RF sputtering on quartz glass. These samples employ a unique, 20-nmthick, ZnON buffer layer, which minimizes the strong thickness dependence of mobility (μ) on thickness (d). A practical waveguide structure, using these measurements, is simulated with COMSOL Multiphysics software over a mid-IR wavelength range of 4-10 μm, with a detailed examination of propagation loss and plasmon confinement dimension. In many cases, Lplas < λlight, thus showing that IR light can be manipulated in semiconductor materials at dimensions below the diffraction limit.
AB - Conventional plasmonic devices involve metals, but metal-based plasmonic resonances are mainly limited to λres < 1 μm, and thus metals interact effectively only with light in the UV and visible ranges. We show that highly doped ZnO can exhibit λres ≥ 1 μm, thus moving plasmonics into the IR range. We illustrate this capability with a set of thin (d = 25-147 nm) Al-doped ZnO (AZO) layers grown by RF sputtering on quartz glass. These samples employ a unique, 20-nmthick, ZnON buffer layer, which minimizes the strong thickness dependence of mobility (μ) on thickness (d). A practical waveguide structure, using these measurements, is simulated with COMSOL Multiphysics software over a mid-IR wavelength range of 4-10 μm, with a detailed examination of propagation loss and plasmon confinement dimension. In many cases, Lplas < λlight, thus showing that IR light can be manipulated in semiconductor materials at dimensions below the diffraction limit.
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U2 - 10.4028/www.scientific.net/JNanoR.28.109
DO - 10.4028/www.scientific.net/JNanoR.28.109
M3 - Article
AN - SCOPUS:84902581785
SN - 1662-5250
VL - 28
SP - 109
EP - 119
JO - Journal of Nano Research
JF - Journal of Nano Research
ER -