Influences of Metal/Ge Contact and Surface Passivation on Light Emission and Detection for Asymmetric Metal/Ge/Metal Diodes

Research output: Contribution to conference › Paper › peer-review

Original language	English
Pages	606-607
Number of pages	2
DOIs	https://doi.org/10.7567/ssdm.2015.a-4-4
Publication status	Published - Sept 29 2015
Event	2015 International Conference on Solid State Devices and Materials (SSDM2015) - Sapporo Convention Center, Sapporo, Japan Duration: Sept 27 2015 → Sept 30 2015

Conference	2015 International Conference on Solid State Devices and Materials (SSDM2015)
Country/Territory	Japan
City	Sapporo
Period	9/27/15 → 9/30/15

Access to Document

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title = "Influences of Metal/Ge Contact and Surface Passivation on Light Emission and Detection for Asymmetric Metal/Ge/Metal Diodes",

author = "T. Maekura and D. Wang and K. Yamamoto and H. Nakashima",

year = "2015",

month = sep,

day = "29",

doi = "10.7567/ssdm.2015.a-4-4",

language = "English",

pages = "606--607",

note = "2015 International Conference on Solid State Devices and Materials (SSDM2015) ; Conference date: 27-09-2015 Through 30-09-2015",

}

TY - CONF

T1 - Influences of Metal/Ge Contact and Surface Passivation on Light Emission and Detection for Asymmetric Metal/Ge/Metal Diodes

AU - Maekura, T.

AU - Wang, D.

AU - Yamamoto, K.

AU - Nakashima, H.

PY - 2015/9/29

Y1 - 2015/9/29

U2 - 10.7567/ssdm.2015.a-4-4

DO - 10.7567/ssdm.2015.a-4-4

M3 - Paper

SP - 606

EP - 607

T2 - 2015 International Conference on Solid State Devices and Materials (SSDM2015)

Y2 - 27 September 2015 through 30 September 2015

ER -