Influence of number of layers on thermal properties of nano-structured zirconia film fabricated by EB-PVD method

Byung Koog Jang; Masato Yoshiya; Hideaki Matsubara

doi:10.2320/jinstmet.69.56

Influence of number of layers on thermal properties of nano-structured zirconia film fabricated by EB-PVD method

Byung Koog Jang, Masato Yoshiya, Hideaki Matsubara

Research output: Contribution to journal › Article › peer-review

1 Citation (Scopus)

Abstract

This work describes the experimental results of thermal conductivity and thermal diffusivity of the multi-layered ZrO ₂-4 mol%Y ₂O ₃ (YSZ) film to develop the low thermal conductive thermal barrier coating. YSZ films with 2-5 layers were deposited on zirconia substrates by Electron Beam-Physical Vapor Deposition (EB-PVD). The YSZ layers consist of porous-columnar grains containing nano-pores. It is noted that multi layers contain residual pores at interface between layers. Density and thermal diffusivity of the multi-layered YSZ film decreased with increasing the number of layers. Consequently, the thermal conductivity of films decreased with increasing the number of layers. The decrease of thermal conductivity in multi layers is caused by increase of total porosity due to increase of the layer-interface pores, resulting the increase of the phonon scattering.

Original language	English
Pages (from-to)	56-60
Number of pages	5
Journal	Nippon Kinzoku Gakkaishi/Journal of the Japan Institute of Metals
Volume	69
Issue number	1
DOIs	https://doi.org/10.2320/jinstmet.69.56
Publication status	Published - Jan 1 2005
Externally published	Yes

All Science Journal Classification (ASJC) codes

Condensed Matter Physics
Mechanics of Materials
Metals and Alloys
Materials Chemistry

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10.2320/jinstmet.69.56

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title = "Influence of number of layers on thermal properties of nano-structured zirconia film fabricated by EB-PVD method",

abstract = "This work describes the experimental results of thermal conductivity and thermal diffusivity of the multi-layered ZrO 2-4 mol%Y 2O 3 (YSZ) film to develop the low thermal conductive thermal barrier coating. YSZ films with 2-5 layers were deposited on zirconia substrates by Electron Beam-Physical Vapor Deposition (EB-PVD). The YSZ layers consist of porous-columnar grains containing nano-pores. It is noted that multi layers contain residual pores at interface between layers. Density and thermal diffusivity of the multi-layered YSZ film decreased with increasing the number of layers. Consequently, the thermal conductivity of films decreased with increasing the number of layers. The decrease of thermal conductivity in multi layers is caused by increase of total porosity due to increase of the layer-interface pores, resulting the increase of the phonon scattering.",

author = "Jang, {Byung Koog} and Masato Yoshiya and Hideaki Matsubara",

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AU - Jang, Byung Koog

AU - Yoshiya, Masato

AU - Matsubara, Hideaki

PY - 2005/1/1

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N2 - This work describes the experimental results of thermal conductivity and thermal diffusivity of the multi-layered ZrO 2-4 mol%Y 2O 3 (YSZ) film to develop the low thermal conductive thermal barrier coating. YSZ films with 2-5 layers were deposited on zirconia substrates by Electron Beam-Physical Vapor Deposition (EB-PVD). The YSZ layers consist of porous-columnar grains containing nano-pores. It is noted that multi layers contain residual pores at interface between layers. Density and thermal diffusivity of the multi-layered YSZ film decreased with increasing the number of layers. Consequently, the thermal conductivity of films decreased with increasing the number of layers. The decrease of thermal conductivity in multi layers is caused by increase of total porosity due to increase of the layer-interface pores, resulting the increase of the phonon scattering.

AB - This work describes the experimental results of thermal conductivity and thermal diffusivity of the multi-layered ZrO 2-4 mol%Y 2O 3 (YSZ) film to develop the low thermal conductive thermal barrier coating. YSZ films with 2-5 layers were deposited on zirconia substrates by Electron Beam-Physical Vapor Deposition (EB-PVD). The YSZ layers consist of porous-columnar grains containing nano-pores. It is noted that multi layers contain residual pores at interface between layers. Density and thermal diffusivity of the multi-layered YSZ film decreased with increasing the number of layers. Consequently, the thermal conductivity of films decreased with increasing the number of layers. The decrease of thermal conductivity in multi layers is caused by increase of total porosity due to increase of the layer-interface pores, resulting the increase of the phonon scattering.

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Influence of number of layers on thermal properties of nano-structured zirconia film fabricated by EB-PVD method

Abstract

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