In situ two-dimensional micro-imaging XAFS with CCD detector

H. Tanida; H. Yamashige; Y. Orikasa; T. Fujimoto; M. Oishi; H. Murayama; H. Arai; M. Katayama; Y. Inada; T. Ohta; Y. Uchimoto; Z. Ogumi

doi:10.1088/1742-6596/430/1/012021

In situ two-dimensional micro-imaging XAFS with CCD detector

H. Tanida, H. Yamashige, Y. Orikasa, T. Fujimoto, M. Oishi, H. Murayama, H. Arai, M. Katayama, Y. Inada, T. Ohta, Y. Uchimoto, Z. Ogumi

Research output: Contribution to journal › Conference article › peer-review

4 Citations (Scopus)

Abstract

In situ two-dimensional (2D) micro-imaging X-ray absorption fine structure (XAFS) measurements were performed in transmission mode using a charge coupled device (CCD) detector, phosphor screen, and magnifying lens. This method makes it possible to display a 2D image with a spatial resolution of around 2 μm at each energy point in a XAFS spectrum. The method was applied to in situ transmission micro-imaging XAFS measurement with a quick scanning technique.

Original language	English
Article number	012021
Journal	Journal of Physics: Conference Series
Volume	430
Issue number	1
DOIs	https://doi.org/10.1088/1742-6596/430/1/012021
Publication status	Published - 2013
Externally published	Yes
Event	15th International Conference on X-Ray Absorption Fine Structure, XAFS 2012 - Beijing, China Duration: Jul 22 2012 → Jul 28 2012

All Science Journal Classification (ASJC) codes

Physics and Astronomy(all)

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10.1088/1742-6596/430/1/012021

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@article{59dc28c3875b48679f2b54666638caea,

title = "In situ two-dimensional micro-imaging XAFS with CCD detector",

abstract = "In situ two-dimensional (2D) micro-imaging X-ray absorption fine structure (XAFS) measurements were performed in transmission mode using a charge coupled device (CCD) detector, phosphor screen, and magnifying lens. This method makes it possible to display a 2D image with a spatial resolution of around 2 μm at each energy point in a XAFS spectrum. The method was applied to in situ transmission micro-imaging XAFS measurement with a quick scanning technique.",

author = "H. Tanida and H. Yamashige and Y. Orikasa and T. Fujimoto and M. Oishi and H. Murayama and H. Arai and M. Katayama and Y. Inada and T. Ohta and Y. Uchimoto and Z. Ogumi",

year = "2013",

doi = "10.1088/1742-6596/430/1/012021",

language = "English",

volume = "430",

journal = "Journal of Physics: Conference Series",

issn = "1742-6588",

publisher = "IOP Publishing Ltd.",

number = "1",

note = "15th International Conference on X-Ray Absorption Fine Structure, XAFS 2012 ; Conference date: 22-07-2012 Through 28-07-2012",

}

TY - JOUR

T1 - In situ two-dimensional micro-imaging XAFS with CCD detector

AU - Tanida, H.

AU - Yamashige, H.

AU - Orikasa, Y.

AU - Fujimoto, T.

AU - Oishi, M.

AU - Murayama, H.

AU - Arai, H.

AU - Katayama, M.

AU - Inada, Y.

AU - Ohta, T.

AU - Uchimoto, Y.

AU - Ogumi, Z.

PY - 2013

Y1 - 2013

N2 - In situ two-dimensional (2D) micro-imaging X-ray absorption fine structure (XAFS) measurements were performed in transmission mode using a charge coupled device (CCD) detector, phosphor screen, and magnifying lens. This method makes it possible to display a 2D image with a spatial resolution of around 2 μm at each energy point in a XAFS spectrum. The method was applied to in situ transmission micro-imaging XAFS measurement with a quick scanning technique.

AB - In situ two-dimensional (2D) micro-imaging X-ray absorption fine structure (XAFS) measurements were performed in transmission mode using a charge coupled device (CCD) detector, phosphor screen, and magnifying lens. This method makes it possible to display a 2D image with a spatial resolution of around 2 μm at each energy point in a XAFS spectrum. The method was applied to in situ transmission micro-imaging XAFS measurement with a quick scanning technique.

UR - http://www.scopus.com/inward/record.url?scp=84877317728&partnerID=8YFLogxK

UR - http://www.scopus.com/inward/citedby.url?scp=84877317728&partnerID=8YFLogxK

U2 - 10.1088/1742-6596/430/1/012021

DO - 10.1088/1742-6596/430/1/012021

M3 - Conference article

AN - SCOPUS:84877317728

SN - 1742-6588

VL - 430

JO - Journal of Physics: Conference Series

JF - Journal of Physics: Conference Series

IS - 1

M1 - 012021

T2 - 15th International Conference on X-Ray Absorption Fine Structure, XAFS 2012

Y2 - 22 July 2012 through 28 July 2012

ER -

In situ two-dimensional micro-imaging XAFS with CCD detector

Abstract

All Science Journal Classification (ASJC) codes

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