TY - JOUR
T1 - In situ microscopy techniques for understanding Li plating and stripping in solid-state batteries
AU - Motoyama, Munekazu
N1 - Publisher Copyright:
© The Author(s) 2024. Published by Oxford University Press on behalf of The Japanese Society of Microscopy. All rights reserved.
PY - 2024/4/1
Y1 - 2024/4/1
N2 - Solid-state batteries have potential to realize a rechargeable Li-metal anode. However, several challenges persist in the charging and discharging processes of the Li-metal anode, which require a fundamental understanding of Li plating and stripping across the interface of solid-state electrolytes (SEs) to address. This review overviews studies on Li-metal anodes in solid-state batteries using in situ observation techniques with an emphasis on Li electrodeposition and dissolution using scanning electron microscopy and SEs such as lithium phosphorus oxynitride and garnet-type compounds such as Li7La3Zr2O12. The previous research is categorized into three topics: (i) Li nucleation, growth and dissolution at the anode-free interface, (ii) electrochemical reduction of SE and (iii) short-circuit phenomena in SE. The current trends of each topic are summarized.
AB - Solid-state batteries have potential to realize a rechargeable Li-metal anode. However, several challenges persist in the charging and discharging processes of the Li-metal anode, which require a fundamental understanding of Li plating and stripping across the interface of solid-state electrolytes (SEs) to address. This review overviews studies on Li-metal anodes in solid-state batteries using in situ observation techniques with an emphasis on Li electrodeposition and dissolution using scanning electron microscopy and SEs such as lithium phosphorus oxynitride and garnet-type compounds such as Li7La3Zr2O12. The previous research is categorized into three topics: (i) Li nucleation, growth and dissolution at the anode-free interface, (ii) electrochemical reduction of SE and (iii) short-circuit phenomena in SE. The current trends of each topic are summarized.
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U2 - 10.1093/jmicro/dfad058
DO - 10.1093/jmicro/dfad058
M3 - Review article
C2 - 38050331
AN - SCOPUS:85190310947
SN - 2050-5698
VL - 73
SP - 184
EP - 195
JO - Microscopy
JF - Microscopy
IS - 2
ER -