TY - GEN
T1 - In-situ evaluation of nanoparticle diameter for visualizing self-assembly process
AU - Ota, Satoshi
AU - Hayashi, Terutake
AU - Takaya, Yasuhiro
PY - 2008
Y1 - 2008
N2 - Self-assembly is one of the few practical methods for fabricating nanostructures. Currently, the fabrication of a nanostructure is determined by the initial conditions such as temperature, concentration of the particle, pH balance, etc. In order to precisely fabricate nanostructure devices using self-assembly, it is necessary to use real-time controlling, which is based on in-situ evaluations. In this study, we have proposed an in-situ particle sizing system to visualize interactions between nanocomponents. The system uses two particle sizing methods to cover a range of particle diameters. In the first method (for diameters of 1-10 nm), particle sizes are evaluated from the rotational diffusion coefficient of Brownian motion using fluorescence polarization. In the second method (for diameters of 10-500 nm), particle sizes are evaluated from the diffusion coefficient of a particle tracking method. The system can be integrated into a fluorescence microscope with a particle tracking system. We constructed an optical system and a particle sizing system and evaluated their properties.
AB - Self-assembly is one of the few practical methods for fabricating nanostructures. Currently, the fabrication of a nanostructure is determined by the initial conditions such as temperature, concentration of the particle, pH balance, etc. In order to precisely fabricate nanostructure devices using self-assembly, it is necessary to use real-time controlling, which is based on in-situ evaluations. In this study, we have proposed an in-situ particle sizing system to visualize interactions between nanocomponents. The system uses two particle sizing methods to cover a range of particle diameters. In the first method (for diameters of 1-10 nm), particle sizes are evaluated from the rotational diffusion coefficient of Brownian motion using fluorescence polarization. In the second method (for diameters of 10-500 nm), particle sizes are evaluated from the diffusion coefficient of a particle tracking method. The system can be integrated into a fluorescence microscope with a particle tracking system. We constructed an optical system and a particle sizing system and evaluated their properties.
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U2 - 10.1117/12.814518
DO - 10.1117/12.814518
M3 - Conference contribution
AN - SCOPUS:57549104164
SN - 9780819473981
T3 - Proceedings of SPIE - The International Society for Optical Engineering
BT - Ninth International Symposium on Laser Metrology
T2 - 9th International Symposium on Laser Metrology
Y2 - 30 June 2008 through 2 July 2008
ER -