In-plane orientation of C-axis oriented YBa2Cu3Ox films on MgO substrates

Masashi Mukaida, Yoshinobu Takano, Kazuaki Chiba, Masanobu Kusunoki, Shigetoshi Ohshima

Research output: Contribution to journalArticlepeer-review

19 Citations (Scopus)


The appearance of 45° grain boundaries in c-axis oriented YBa2Cu3Ox films grown by pulsed laser deposition on MgO (001) substrates is discussed. X-ray φ-scan (in-plane orientation) measurements have revealed that YBa2Cu3Ox films grown at around 700°C have two types of grains with [100]Mgo ∥ [100]YBCO and [110]MgO ∥ [100]YBCO in-plane epitaxial relationships. A plausible growth model is proposed from the viewpoints of lattice matching and ionic adhesive energy. The ratio of 0° and 45° grains is found to be a function of the substrate temperature. By decreasing the substrate temperature, we obtained c-axis oriented YBa2Cu3Ox thin films with only a [100]Mgo ∥ [100]YBCO in-plane epitaxial relation. We have eliminated the 45° grain boundaries which drastically increase the surface resistance of the YBa2Cu3Ox films for microwave applications.

Original languageEnglish
Pages (from-to)1945-1948
Number of pages4
JournalJapanese Journal of Applied Physics
Issue number4 A
Publication statusPublished - 1999
Externally publishedYes

All Science Journal Classification (ASJC) codes

  • General Engineering
  • General Physics and Astronomy


Dive into the research topics of 'In-plane orientation of C-axis oriented YBa2Cu3Ox films on MgO substrates'. Together they form a unique fingerprint.

Cite this