In-plane alignment of a-axis oriented YBa2Cu3O x thin films

Masashi Mukaida; Shintaro Miyazawa

doi:10.1063/1.109819

In-plane alignment of a-axis oriented YBa₂Cu₃O _x thin films

Masashi Mukaida, Shintaro Miyazawa

Research output: Contribution to journal › Article › peer-review

86 Citations (Scopus)

Abstract

The in-plane orientation of a-axis oriented YBa₂Cu ₃O_x thin films on SrLaGaO₄ (100) substrates is studied by φ-scan (in-plane rotation) x-ray diffraction, reflection high energy electron diffraction, and planar-view transmission electron microscopy measurements. It is revealed that the thin films exhibit a twofold symmetry, indicating independent b- and c-axis orientations in the surface plane. There are no 90°domains, and the c-axis of a-axis oriented YBa₂Cu ₃O_x thin films on SrLaGaO₄ (100) is aligned to the [001] direction of the substrate azimuth. The resistivity in the c-axis direction at 290 K is 5.5 mΩ cm, about eleven times larger than that in the a-axis direction. The temperature differential of normalized resistivity, d[R(T)/R(300)]/dT, in the c-axis direction (1.1×10^-3 K ^-1) is smaller than that in the b-axis direction (2.8×10 ^-3 K^-1).

Original language	English
Pages (from-to)	999-1001
Number of pages	3
Journal	Applied Physics Letters
Volume	63
Issue number	7
DOIs	https://doi.org/10.1063/1.109819
Publication status	Published - 1993
Externally published	Yes

All Science Journal Classification (ASJC) codes

Physics and Astronomy (miscellaneous)

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10.1063/1.109819

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title = "In-plane alignment of a-axis oriented YBa2Cu3O x thin films",

abstract = "The in-plane orientation of a-axis oriented YBa2Cu 3Ox thin films on SrLaGaO4 (100) substrates is studied by φ-scan (in-plane rotation) x-ray diffraction, reflection high energy electron diffraction, and planar-view transmission electron microscopy measurements. It is revealed that the thin films exhibit a twofold symmetry, indicating independent b- and c-axis orientations in the surface plane. There are no 90°domains, and the c-axis of a-axis oriented YBa2Cu 3Ox thin films on SrLaGaO4 (100) is aligned to the [001] direction of the substrate azimuth. The resistivity in the c-axis direction at 290 K is 5.5 mΩ cm, about eleven times larger than that in the a-axis direction. The temperature differential of normalized resistivity, d[R(T)/R(300)]/dT, in the c-axis direction (1.1×10-3 K -1) is smaller than that in the b-axis direction (2.8×10 -3 K-1).",

author = "Masashi Mukaida and Shintaro Miyazawa",

year = "1993",

doi = "10.1063/1.109819",

language = "English",

volume = "63",

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journal = "Applied Physics Letters",

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T1 - In-plane alignment of a-axis oriented YBa2Cu3O x thin films

AU - Mukaida, Masashi

AU - Miyazawa, Shintaro

PY - 1993

Y1 - 1993

N2 - The in-plane orientation of a-axis oriented YBa2Cu 3Ox thin films on SrLaGaO4 (100) substrates is studied by φ-scan (in-plane rotation) x-ray diffraction, reflection high energy electron diffraction, and planar-view transmission electron microscopy measurements. It is revealed that the thin films exhibit a twofold symmetry, indicating independent b- and c-axis orientations in the surface plane. There are no 90°domains, and the c-axis of a-axis oriented YBa2Cu 3Ox thin films on SrLaGaO4 (100) is aligned to the [001] direction of the substrate azimuth. The resistivity in the c-axis direction at 290 K is 5.5 mΩ cm, about eleven times larger than that in the a-axis direction. The temperature differential of normalized resistivity, d[R(T)/R(300)]/dT, in the c-axis direction (1.1×10-3 K -1) is smaller than that in the b-axis direction (2.8×10 -3 K-1).

AB - The in-plane orientation of a-axis oriented YBa2Cu 3Ox thin films on SrLaGaO4 (100) substrates is studied by φ-scan (in-plane rotation) x-ray diffraction, reflection high energy electron diffraction, and planar-view transmission electron microscopy measurements. It is revealed that the thin films exhibit a twofold symmetry, indicating independent b- and c-axis orientations in the surface plane. There are no 90°domains, and the c-axis of a-axis oriented YBa2Cu 3Ox thin films on SrLaGaO4 (100) is aligned to the [001] direction of the substrate azimuth. The resistivity in the c-axis direction at 290 K is 5.5 mΩ cm, about eleven times larger than that in the a-axis direction. The temperature differential of normalized resistivity, d[R(T)/R(300)]/dT, in the c-axis direction (1.1×10-3 K -1) is smaller than that in the b-axis direction (2.8×10 -3 K-1).

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In-plane alignment of a-axis oriented YBa₂Cu₃O _x thin films

Abstract

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