In-field characterization of FeTe0.8S0.2 epitaxial thin films with enhanced superconducting properties

Paolo Mele; Kaname Matsumoto; Yasunori Haruyama; Masashi Mukaida; Yutaka Yoshida; Yusuke Ichino; Takanobu Kiss; Ataru Ichinose

doi:10.1088/0953-2048/23/5/052001

In-field characterization of FeTe_0.8S_0.2 epitaxial thin films with enhanced superconducting properties

Paolo Mele
, Kaname Matsumoto
, Yasunori Haruyama
, Masashi Mukaida
, Yutaka Yoshida
, Yusuke Ichino
, Takanobu Kiss
, Ataru Ichinose

Section of Measurement and Control Engineering

Research output: Contribution to journal › Article › peer-review

29 Citations (Scopus)

Abstract

Epitaxial Fe-Te-S thin films (thickness range 100-200nm) were deposited by pulsed laser deposition at 400 °C on SrTiO₃(100) and MgO(100) single-crystal substrates. The films reached the zero-resistance condition: T_c⁰ = 3.54K for on SrTiO₃ and 5.37K for on MgO, and presented a large upper critical field: T for on SrTiO₃ and 74.2T for on MgO, using 90% of the normal state resistance and the Werthamer-Helfand-Hohenberg model. The coherence length ξ₀ is very short: 2.30nm for on SrTiO₃ and 2.10nm for on MgO. The film grown on MgO showed T; then the isotropic parameter γ is 1.09. The best J _c observed is 10⁴Acm^-2 (at 2K, self-field) for the sample deposited on MgO.

Original language	English
Article number	052001
Journal	Superconductor Science and Technology
Volume	23
Issue number	5
DOIs	https://doi.org/10.1088/0953-2048/23/5/052001
Publication status	Published - 2010

All Science Journal Classification (ASJC) codes

Ceramics and Composites
Condensed Matter Physics
Metals and Alloys
Electrical and Electronic Engineering
Materials Chemistry

Access to Document

10.1088/0953-2048/23/5/052001

Cite this

@article{20bdf048cd4949b9873b2f0b096aaa5a,

title = "In-field characterization of FeTe0.8S0.2 epitaxial thin films with enhanced superconducting properties",

abstract = "Epitaxial Fe-Te-S thin films (thickness range 100-200nm) were deposited by pulsed laser deposition at 400 °C on SrTiO3(100) and MgO(100) single-crystal substrates. The films reached the zero-resistance condition: Tc0 = 3.54K for on SrTiO3 and 5.37K for on MgO, and presented a large upper critical field: T for on SrTiO3 and 74.2T for on MgO, using 90\% of the normal state resistance and the Werthamer-Helfand-Hohenberg model. The coherence length ξ0 is very short: 2.30nm for on SrTiO3 and 2.10nm for on MgO. The film grown on MgO showed T; then the isotropic parameter γ is 1.09. The best J c observed is 104Acm-2 (at 2K, self-field) for the sample deposited on MgO.",

author = "Paolo Mele and Kaname Matsumoto and Yasunori Haruyama and Masashi Mukaida and Yutaka Yoshida and Yusuke Ichino and Takanobu Kiss and Ataru Ichinose",

year = "2010",

doi = "10.1088/0953-2048/23/5/052001",

language = "English",

volume = "23",

journal = "Superconductor Science and Technology",

issn = "0953-2048",

publisher = "Institute of Physics",

number = "5",

}

TY - JOUR

T1 - In-field characterization of FeTe0.8S0.2 epitaxial thin films with enhanced superconducting properties

AU - Mele, Paolo

AU - Matsumoto, Kaname

AU - Haruyama, Yasunori

AU - Mukaida, Masashi

AU - Yoshida, Yutaka

AU - Ichino, Yusuke

AU - Kiss, Takanobu

AU - Ichinose, Ataru

PY - 2010

Y1 - 2010

N2 - Epitaxial Fe-Te-S thin films (thickness range 100-200nm) were deposited by pulsed laser deposition at 400 °C on SrTiO3(100) and MgO(100) single-crystal substrates. The films reached the zero-resistance condition: Tc0 = 3.54K for on SrTiO3 and 5.37K for on MgO, and presented a large upper critical field: T for on SrTiO3 and 74.2T for on MgO, using 90% of the normal state resistance and the Werthamer-Helfand-Hohenberg model. The coherence length ξ0 is very short: 2.30nm for on SrTiO3 and 2.10nm for on MgO. The film grown on MgO showed T; then the isotropic parameter γ is 1.09. The best J c observed is 104Acm-2 (at 2K, self-field) for the sample deposited on MgO.

AB - Epitaxial Fe-Te-S thin films (thickness range 100-200nm) were deposited by pulsed laser deposition at 400 °C on SrTiO3(100) and MgO(100) single-crystal substrates. The films reached the zero-resistance condition: Tc0 = 3.54K for on SrTiO3 and 5.37K for on MgO, and presented a large upper critical field: T for on SrTiO3 and 74.2T for on MgO, using 90% of the normal state resistance and the Werthamer-Helfand-Hohenberg model. The coherence length ξ0 is very short: 2.30nm for on SrTiO3 and 2.10nm for on MgO. The film grown on MgO showed T; then the isotropic parameter γ is 1.09. The best J c observed is 104Acm-2 (at 2K, self-field) for the sample deposited on MgO.

UR - https://www.scopus.com/pages/publications/77951627912

UR - https://www.scopus.com/pages/publications/77951627912#tab=citedBy

U2 - 10.1088/0953-2048/23/5/052001

DO - 10.1088/0953-2048/23/5/052001

M3 - Article

AN - SCOPUS:77951627912

SN - 0953-2048

VL - 23

JO - Superconductor Science and Technology

JF - Superconductor Science and Technology

IS - 5

M1 - 052001

ER -

In-field characterization of FeTe_0.8S_0.2 epitaxial thin films with enhanced superconducting properties

Abstract

All Science Journal Classification (ASJC) codes

Access to Document

Other files and links

Fingerprint

Cite this