In-field characterization of FeTe0.8S0.2 epitaxial thin films with enhanced superconducting properties

Paolo Mele; Kaname Matsumoto; Yasunori Haruyama; Masashi Mukaida; Yutaka Yoshida; Yusuke Ichino; Takanobu Kiss; Ataru Ichinose

doi:10.1088/0953-2048/23/5/052001

In-field characterization of FeTe_0.8S_0.2 epitaxial thin films with enhanced superconducting properties

Paolo Mele, Kaname Matsumoto, Yasunori Haruyama, Masashi Mukaida, Yutaka Yoshida, Yusuke Ichino, Takanobu Kiss, Ataru Ichinose

Section of Measurement and Control Engineering

Research output: Contribution to journal › Article › peer-review

29 Citations (Scopus)

Abstract

Epitaxial Fe-Te-S thin films (thickness range 100-200nm) were deposited by pulsed laser deposition at 400 °C on SrTiO₃(100) and MgO(100) single-crystal substrates. The films reached the zero-resistance condition: T_c⁰ = 3.54K for on SrTiO₃ and 5.37K for on MgO, and presented a large upper critical field: T for on SrTiO₃ and 74.2T for on MgO, using 90% of the normal state resistance and the Werthamer-Helfand-Hohenberg model. The coherence length ξ₀ is very short: 2.30nm for on SrTiO₃ and 2.10nm for on MgO. The film grown on MgO showed T; then the isotropic parameter γ is 1.09. The best J _c observed is 10⁴Acm^-2 (at 2K, self-field) for the sample deposited on MgO.

Original language	English
Article number	052001
Journal	Superconductor Science and Technology
Volume	23
Issue number	5
DOIs	https://doi.org/10.1088/0953-2048/23/5/052001
Publication status	Published - May 4 2010

All Science Journal Classification (ASJC) codes

Ceramics and Composites
Condensed Matter Physics
Metals and Alloys
Electrical and Electronic Engineering
Materials Chemistry

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10.1088/0953-2048/23/5/052001

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title = "In-field characterization of FeTe0.8S0.2 epitaxial thin films with enhanced superconducting properties",

abstract = "Epitaxial Fe-Te-S thin films (thickness range 100-200nm) were deposited by pulsed laser deposition at 400 °C on SrTiO3(100) and MgO(100) single-crystal substrates. The films reached the zero-resistance condition: Tc0 = 3.54K for on SrTiO3 and 5.37K for on MgO, and presented a large upper critical field: T for on SrTiO3 and 74.2T for on MgO, using 90% of the normal state resistance and the Werthamer-Helfand-Hohenberg model. The coherence length ξ0 is very short: 2.30nm for on SrTiO3 and 2.10nm for on MgO. The film grown on MgO showed T; then the isotropic parameter γ is 1.09. The best J c observed is 104Acm-2 (at 2K, self-field) for the sample deposited on MgO.",

author = "Paolo Mele and Kaname Matsumoto and Yasunori Haruyama and Masashi Mukaida and Yutaka Yoshida and Yusuke Ichino and Takanobu Kiss and Ataru Ichinose",

year = "2010",

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doi = "10.1088/0953-2048/23/5/052001",

language = "English",

volume = "23",

journal = "Superconductor Science and Technology",

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T1 - In-field characterization of FeTe0.8S0.2 epitaxial thin films with enhanced superconducting properties

AU - Mele, Paolo

AU - Matsumoto, Kaname

AU - Haruyama, Yasunori

AU - Mukaida, Masashi

AU - Yoshida, Yutaka

AU - Ichino, Yusuke

AU - Kiss, Takanobu

AU - Ichinose, Ataru

PY - 2010/5/4

Y1 - 2010/5/4

N2 - Epitaxial Fe-Te-S thin films (thickness range 100-200nm) were deposited by pulsed laser deposition at 400 °C on SrTiO3(100) and MgO(100) single-crystal substrates. The films reached the zero-resistance condition: Tc0 = 3.54K for on SrTiO3 and 5.37K for on MgO, and presented a large upper critical field: T for on SrTiO3 and 74.2T for on MgO, using 90% of the normal state resistance and the Werthamer-Helfand-Hohenberg model. The coherence length ξ0 is very short: 2.30nm for on SrTiO3 and 2.10nm for on MgO. The film grown on MgO showed T; then the isotropic parameter γ is 1.09. The best J c observed is 104Acm-2 (at 2K, self-field) for the sample deposited on MgO.

AB - Epitaxial Fe-Te-S thin films (thickness range 100-200nm) were deposited by pulsed laser deposition at 400 °C on SrTiO3(100) and MgO(100) single-crystal substrates. The films reached the zero-resistance condition: Tc0 = 3.54K for on SrTiO3 and 5.37K for on MgO, and presented a large upper critical field: T for on SrTiO3 and 74.2T for on MgO, using 90% of the normal state resistance and the Werthamer-Helfand-Hohenberg model. The coherence length ξ0 is very short: 2.30nm for on SrTiO3 and 2.10nm for on MgO. The film grown on MgO showed T; then the isotropic parameter γ is 1.09. The best J c observed is 104Acm-2 (at 2K, self-field) for the sample deposited on MgO.

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VL - 23

JO - Superconductor Science and Technology

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ER -

In-field characterization of FeTe_0.8S_0.2 epitaxial thin films with enhanced superconducting properties

Abstract

All Science Journal Classification (ASJC) codes

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