Imaging of distribution of surface charges on micropatterned organosilane monolayer based on chemical force microscopic observation

Two dimensional distribution of Surface Charges on Micropatterned Organosilane Monolayer was imaged using chemical force microscope (CFM) by detecting of electrostatic interaction. Magnitude of the electrostatic interaction depended on charged states of surface functional groups. The imaging of micropatterned charged monolayer surfaces was successfully achieved by using lateral force measurement with the cantilever tip modified with sulfonic acid groups or amino groups. This technique is based on the detection of electrostatic attractive or repulsive force between terminal functional groups of monolayer surface and cantilever tip surface. The magnitude of lateral force could be controlled by optimizing the electrostatic condition of the terminal functional groups. It is expected that the CFM imaging technique based on the electrostatic interaction will become a powerful tool to understand the surface properties of various charged material surfaces, such as model of biocompatible materials and template materials.